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RESEARCH PRODUCT

Applications of near-field optics to the characterization of optoelectronics components

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In the race towards purely optical communications, the necessity of producing integrated components is linked to the requirement for the precise characteriza-tion of optoelectronic components. Near-field detection techniques meet this requirement, AFM (Atomic Force Microscopy), for instance, can provide the topography of a given sample. In conjunction with these new tools, several different kinds of near-field optical microscopes (NFOM) have appeared. They enable the characteriza-tion of the components with a resolution better than that imposed by the Rayleigh criterion. This is primarily due to the fact that they are sensitive to the evanescent waves. This document presents several areas related to telecommunications where near-field optics has become relevant. Dans la course au tout optique, la necessite de reali-ser des composants integres s’accompagne de L’obliga-tion de la caracterisation fine de ces composants. Les techniques de detection en champ proche repondent a ces besoins. La microscopie a force atomique AFM peut fournir la topographie de divers elements. En paral-lele de ces nouveaux outils, diverses microscopies en champ proche optique ont vu le jour, elles permettent d’acceder a la caracterisation des composants avec une resolution qui depasse le critere de Rayleigh, ceci parce qu’elles detectent entre autres les ondes evanescentes. Nous avons choisi de presenter quelques domaines liees aux telecommunications oU I’optique en champ proche a fait pour l’instant une incursion.