6533b851fe1ef96bd12aa235
RESEARCH PRODUCT
A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations.
Lukas KonradJohn J. RehrMartina LattemannChristian GspanHaishuang ZhaoGerald KothleitnerUte Kolbsubject
010302 applied physicsDiffractionOffset (computer science)Hard metalGeneral Physics and AstronomyStructural diversity02 engineering and technologyCell BiologyElectron021001 nanoscience & nanotechnology01 natural sciencesHard metalsStructural BiologyTransmission electron microscopy0103 physical sciencesGeneral Materials Science0210 nano-technologySpectroscopyBiological systemdescription
This work addresses aspects for the analysis of industrial relevant materials via transmission electron microscopy (TEM). The complex phase chemistry and structural diversity of these materials require several characterization techniques to be employed simultaneously; unfortunately, different characterization techniques often lack connection to yield a complete and consistent picture. This paper describes a continuous path, starting with the acquisition of 3D diffraction data - alongside classical high-resolution imaging techniques - and linking the structural characterization of hard metal industrial samples with energy-loss fine-structure simulations, quantitative electron energy-loss (EEL) and energy-dispersive X-ray (EDX) spectroscopy. Thereby, the compositional analysis of a MAX phase indicated an offset of the hydrogenic, theoretical sensitivity factors, originating from poorly-adjusted screening factors. In a next step, these results were matched against quantitative compositions and parameters obtained from X-ray spectroscopy data, carried out synchronously with EELS.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2018-12-01 | Micron (Oxford, England : 1993) |