6533b852fe1ef96bd12abdf8
RESEARCH PRODUCT
Defects in topmost oxide layers probed by resonant photoelectron diffraction.
Bruno Domenichinisubject
ComputingMilieux_MISCELLANEOUSdescription
International audience
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2010-06-22 |