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RESEARCH PRODUCT
Detection of phase transitions in thin films with a quartz crystal microbalance
Markus SeitzRalf WeberskirchHelmut RingsdorfFelix J. B. KremerA. Schustersubject
chemistry.chemical_classificationPhase transitionMaterials scienceLayer by layerMetals and AlloysAnalytical chemistrySurfaces and InterfacesQuartz crystal microbalancePolymerSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialschemistryAmphiphileMaterials ChemistryThin filmdescription
Abstract The quartz crystal microbalance (QCM) is used to determine the phase transition point of thin films by measuring the change in frequency as a function of temperature. To elucidate this relationship, two types of polymers were studied where the bulk phase transitions were known. We investigated a casted thin film of an amphiphilic polyoxazoline and a Langmuir-Blodgett film comprised of fifteen double layers of an amphotropic polyacrylate. The phase transition points of the thin films could be detected by the QCM which were in the same range as for the bulk materials.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-09-01 | Thin Solid Films |