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RESEARCH PRODUCT
Integrated Optical Technique for Detection of Electro-Optical Non-Linearities in Thin Films
S. AglieriV. DaneuS. Riva-sanseverinoClaudio Calisubject
Kerr effectMaterials scienceSilicon photonicsgenetic structuresbusiness.industryNonlinear opticsWaveguide (optics)eye diseasesSlot-waveguideOpticsElectric fieldOptoelectronicsbusinessRefractive indexVoltagedescription
A simple method for detection of electro-optical non-linearities in thin films is presented. The method involves an easily fabricated structure and a little practice in integrated optical techniques. It is also possible to detect small induced variations of refractive index, using lower voltage with respect to those applied in a conventional Kerr cell. We have sucessfully tested our method using two different polymer materials as thin films. In both of these we have observed an induced ?n ? 3 10?5 with an electric field of 60 V/?, with a response time round about 300 nsec. The experimental values of induced ?n versus electric field fit very well a parabola, proving the quadratic behavior of Kerr effect.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1976-09-01 | 1976 6th European Microwave Conference |