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RESEARCH PRODUCT
Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements
Bastian HarrachJin Keun Seosubject
Mathematical optimizationRobustness (computer science)Applied MathematicsFactorization methodNew variantInverse problemAlgorithmElectrical impedance tomographyMathematicsdescription
We develop a new variant of the factorization method that can be used to detect inclusions in electrical impedance tomography from either absolute current-to-voltage measurements at a single, nonzero frequency or from frequency-difference measurements. This eliminates the need for numerically simulated reference measurements at an inclusion-free body and thus greatly improves the method's robustness against forward modeling errors, e.g., in the assumed body's shape.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2009-01-01 | SIAM Journal on Applied Mathematics |