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RESEARCH PRODUCT
Deformation-Free Topography from Combined Scanning Force and Tunnelling Experiments
H.-j. GüntherodtHeinrich RohrerChristoph GerberBruno MichelDario AnselmettiDario AnselmettiHeiko Wolfsubject
Materials sciencebusiness.industryELECTRON MICROSCOPY DETERMINATIONS (INC SCANNING TUNNELING MICROSCOPYMECHANICAL ANDGeneral Physics and AstronomyStiffnessSOLID-SOLID INTERFACES (INC BICRYSTALS)Deformation (meteorology)METHODS)law.inventionOpticslawMicroscopyMonolayermedicineACOUSTICAL PROPERTIES OF SOLID SURFACES AND INTERFACESThin filmComposite materialScanning tunneling microscopemedicine.symptombusinessQuantum tunnellingdescription
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1993-08-20 | Europhysics Letters (EPL) |