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RESEARCH PRODUCT

Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object's Surface in Mirror Electron Microscopy

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Abstract The contrast depth is analyzed as well, that is the sensitivity of electron mirror microscope to disorders of homogeneity on the object (local magnetic and electric fields, surface relief). Because of the latter ones, electron trajectories feel disturbances (electrons acquire additional increment velocity in radial and azimuthal directions), which leads to the shift of the observed point on the screen and, as a consequence, to the image contrast. Since the electron energy, when reflected, tends to zero, electrons are influenced by heterogeneities for a long time. It causes high sensitivity to heterogeneities, up to the crossing of electron trajectories (caustics are generated). The conditions of caustic generation at the expense of local electric or magnetic field are analyzed. Both the direct and the inverse problems are considered with regard to studies of objects with electric and magnetic fields. Derived equations provide opportunity for reconstruction of electric or magnetic fields distribution on the surface of the object from the images obtained by means of the mirror electron microscope.