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RESEARCH PRODUCT
Quantitative determination of fayalite layers on iron by CEMS
P. GriesbachPhilipp GütlichH. J. GrabkeW. Meiselsubject
Nuclear and High Energy PhysicsMaterials scienceSiliconSilicon ironMetallurgyOxidechemistry.chemical_elementengineering.materialCondensed Matter PhysicsAtomic and Molecular Physics and OpticsQuantitative determinationchemistry.chemical_compoundchemistryengineeringFayaliteWüstitePhysical and Theoretical ChemistryThin filmLayer (electronics)description
In the processing of silicon iron (Fe-3%) Si), so-called ‘fayalite layers’ are formed. By CEMS, they were found to consist of an outer Fe3+-oxide layer and an inner Fe2SiO4 (fayalite) layer. Sometimes an additional wustite contribution was found. Thef-factor of fayalite was determined experimentally (ffayalite/fα-Fe=0.47±0.04) and, by use of it, the thicknesses of the layers on some silicon iron samples could be calculated from CEMS data.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1990-07-01 | Hyperfine Interactions |