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RESEARCH PRODUCT
X-ray fluorescence analysis by the fundamental parameters method without explicit knowledge of the excitation beam spectrum
V. Delgado MartínezC. Martínez HidalgoRaúl A. Barreasubject
Opticsbusiness.industryChemistrySpectrum (functional analysis)Turn (geometry)Excitation beamX-ray fluorescenceExplicit knowledgebusinessFluorescenceSpectroscopyBeam (structure)description
The results of analyses carried out with the fundamental parameters method without explicit knowledge of the beam exciting the sample are presented. The excitation beam is described by means of the fluorescence produced by a set of thick or thin targets of pure chemical elements. The results are compared with those obtained by using a semi-empirical model and an adjusted spectrum model, all sets of results being in turn compared with the actual chemical composition of the samples. It is concluded that the description of the excitation beam by means of the fluorescence produced on targets of pure elements is suitable for use with the fundamental parameters method. Copyright © 2000 John Wiley & Sons, Ltd.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2000-05-01 | X-Ray Spectrometry |