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RESEARCH PRODUCT

Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite

K. KnorrUlrich G. VolkmannJ.w.o. Faul

subject

ArgonKryptonchemistry.chemical_elementMineralogyNoble gasSurfaces and InterfacesCondensed Matter PhysicsMolecular physicsSurfaces Coatings and FilmsXenonPhysisorptionchemistryEllipsometryPolarizabilityMaterials ChemistryGraphite

description

Multilayer isotherms of Xe, Kr, Ar and N2 physisorbed on graphite (001) have been studied by ellipsometry. It is shown that the model of Dignam and Fedyk provides an excellent basis for the interpretation of the ellipsometric thickness in terms of the coverage and the polarizability of the admolecules. For N2 conclusions concerning the orientation of the molecule are drawn.

https://doi.org/10.1016/s0039-6028(05)80026-3