6533b85ffe1ef96bd12c0f73
RESEARCH PRODUCT
Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite
K. KnorrUlrich G. VolkmannJ.w.o. Faulsubject
ArgonKryptonchemistry.chemical_elementMineralogyNoble gasSurfaces and InterfacesCondensed Matter PhysicsMolecular physicsSurfaces Coatings and FilmsXenonPhysisorptionchemistryEllipsometryPolarizabilityMaterials ChemistryGraphitedescription
Multilayer isotherms of Xe, Kr, Ar and N2 physisorbed on graphite (001) have been studied by ellipsometry. It is shown that the model of Dignam and Fedyk provides an excellent basis for the interpretation of the ellipsometric thickness in terms of the coverage and the polarizability of the admolecules. For N2 conclusions concerning the orientation of the molecule are drawn.
year | journal | country | edition | language |
---|---|---|---|---|
1990-03-01 | Surface Science |