6533b85ffe1ef96bd12c1019

RESEARCH PRODUCT

Surface and Thin Film Analysis by Mössbauer Spectroscopy and Related Techniques

W. Meisel

subject

Surface (mathematics)Auger electron spectroscopyMaterials scienceThin layerMiniaturizationNanotechnologyElectronicsMicroreactorThin filmMechanical components

description

The main trend in current high-tech development is miniaturization. This holds for complex electronic devices, such as microprocessors, as well as for coatings, such as Langmuir-Blodgett coatings, optical components, such as fiber couplers, chemical devices, such as microreactors, mechanical components, such as micromotors, and many others. Development and production of components with dimensions in the micron and submicron range require the availability of appropriate analytical tools for chemical, physical, and morphological analyses. In close interaction with the development of microcomponents, many, more and more efficient, analytical methods have been developed, many of which are “surface and thin layer methods.” For brevity, they are often described by acronyms, and, to date, more than a hundred different acronyms are in use in this field. A selection of these acronyms is given in Table 1.

https://doi.org/10.1007/978-1-4899-1763-8_1