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RESEARCH PRODUCT

X-ray absorption spectroscopy of Cu-doped $WO_{3}$ films for use inelectrochemical metallization cell memory

R. KalendarevAlexei KuzminJanis TimoshenkoAndris AnspoksAleksandr Kalinko

subject

X-ray absorption spectroscopyMaterials scienceExtended X-ray absorption fine structureAbsorption spectroscopyAnnealing (metallurgy)Analytical chemistrySynchrotron radiationElectronic structureCondensed Matter PhysicsXANESElectronic Optical and Magnetic MaterialsMaterials ChemistryCeramics and Compositesddc:660Thin film

description

Abstract We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO 3 /Cu/WO 3 /Si and WO 3 /Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO 3 films is proposed.

yearjournalcountryeditionlanguage
2014-10-01
10.1016/j.jnoncrysol.2014.01.022https://bib-pubdb1.desy.de/record/171212