6533b860fe1ef96bd12c3509

RESEARCH PRODUCT

Dangerous Effects Induced on Power MOSFETs by Terrestrial Neutrons

G ConsentinoA LaudaniG PriviteraC PaceC GiordanoM MazzeoJl Hernandez AmbatoN MarcheseAldo ParlatoElio Angelo Tomarchio

subject

reliabilitypower MOSFETaccelerated testSEBSettore ING-IND/20 - Misure E Strumentazione NucleariTerrestrial neutronAm-Be sourceSettore ING-INF/01 - ElettronicaSEESEGR

description

This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biased during their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source at the University of Palermo are discussed.

yearjournalcountryeditionlanguage
2013-01-01
http://hdl.handle.net/10447/98196