6533b860fe1ef96bd12c3986

RESEARCH PRODUCT

Multipactor RF Breakdown in Coaxial Transmission Lines With Digitally Modulated Signals

Daniel Gonzalez-iglesiasBenito Gimeno MartínezVicente E. BoriaPetronilo Martin IglesiasO. MonerrisM. E. Díaz

subject

Multipactor effectEngineeringAcoustics02 engineering and technology01 natural sciences010305 fluids & plasmasHarmonic analysisAmplitude modulationDigital modulationTEORIA DE LA SEÑAL Y COMUNICACIONES0103 physical sciences0202 electrical engineering electronic engineering information engineeringElectronic engineeringElectrical and Electronic EngineeringQuadrature amplitude modulation (QAM)Coaxial waveguidesbusiness.industry20-gap-crossing ruleRoot-raised-cosine filterRF breakdown020206 networking & telecommunicationsKeyingElectronic Optical and Magnetic MaterialsElectric power transmissionAmplitude and phaseshift keying (APSK)Multipactor effectRadio frequencybusinessQuadrature phase-shift keying (QPSK)Phase-shift keyingVoltage

description

The aim of this paper is the study of the RF multipactor breakdown in coaxial transmission lines excited by a single carrier with a digitally modulated signal. Employing an in-house developed code, numerical simulations are performed to determine the RF multipactor voltage threshold for several digitally modulated signals under different modulations schemes: quadrature phase-shift keying, 16-quadrature amplitude modulation, 16-amplitude and phase-shift keying, and 32-amplitude and phase-shift keying. Moreover, a coarse method based on the envelope integration to determine the RF multipactor voltage threshold when involving arbitrary digital modulations is also presented. These results are also compared with the 20-gap-crossing rule used in the space standard document ECSS-E20-1A. In order to validate the theoretical results, a test campaign was performed for realistic modulated signals, finding good agreement between theoretical predictions and experimental data.

yearjournalcountryeditionlanguage
2016-10-01IEEE Transactions on Electron Devices
https://doi.org/10.1109/ted.2016.2596801