6533b861fe1ef96bd12c4293

RESEARCH PRODUCT

A phenomenological approach to the mechanical breakdown of anodic oxide films on zirconium

Carmelo SunseriSalvatore PiazzaFrancesco Di Quarto

subject

ZirconiumMaterials scienceAnodizingGeneral Chemical EngineeringMetallurgyThermodynamicschemistry.chemical_elementGeneral ChemistryElectrolyteKinetic energyAnodeCorrosionchemistryBreakdown voltageGeneral Materials ScienceCurrent density

description

Abstract A phenomenological theory of the mechanical breakdown of films growing on valve metals during galvanostatic oxidation is presented and discussed in detail for ZrO2 anodic films. It is shown that the mechanical breakdown voltage, Vmb, can be linearly related to the logarithm of the anodizing current density both in the case of constant and variable critical thickness, Lc, at which the breakdown occurs. It is also shown that the Amb and Bmb parameters of the relationship: Vmb = Amb + Bmb log i are strictly related to the kinetic parameters of growth of the films in the different solutions. The expressions of Amb and Bmb parameters are derived for films grown in the presence as well as in the absence of space-charge effects. A quantitative check of the equations obtained is presented for different ZrO2/electrolyte systems.

yearjournalcountryeditionlanguage
1986-01-01Corrosion Science
https://doi.org/10.1016/0010-938x(86)90056-9