6533b86cfe1ef96bd12c7f05
RESEARCH PRODUCT
Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves
M. SanninoA. Di PaolaA. Caddemisubject
Noise temperatureEngineeringNoiseNoise-figure meterNoise generatorNoise measurementbusiness.industryElectronic engineeringY-factorFlicker noiseNoise figurebusinessdescription
The good performances of a set-up for the complete characterization of HEMTs up to 40 Ghz in terms of noise and scattering parameters through noise figure measurements only are shown by many experimental results. Because of some inconveniences in practice the use of the method is suggested for research laboratories only. For industrial applications an alternative symplified method is proposed whose performances are shown to be in surprising agreement with the ones of the standard method.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-10-01 | 26th European Microwave Conference, 1996 |