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RESEARCH PRODUCT

Polarized Fourier transform infrared microscopy as a tool for structural analysis of adsorbates in molecular sieves

Ferdi SchüthFerdi Schüth

subject

DiffractionChemistryResolution (electron density)General EngineeringAnalytical chemistryInfrared spectroscopysymbols.namesakeFourier transformMicroscopyX-ray crystallographysymbolsPhysical and Theoretical ChemistryFourier transform infrared spectroscopyInfrared microscopy

description

Using FTIR microscopy with polarized IR radiation on silicalite I single crystals fully loaded with p-xylene, the existence of an ordered adsorbate could be proven for the first time by IR spectroscopy. By analyzing the polarized absorption bands the orientation of the p-xylene molecules relative to the host structure could be determined. The results agree well with structural data obtained from X-ray diffraction experiments. These first results suggest that polarized IR microscopy could develop into a powerful tool for the analysis of adsorbate structures, assisting in complete structure resolution by diffraction techniques

yearjournalcountryeditionlanguage
1992-09-01The Journal of Physical Chemistry
https://doi.org/10.1021/j100198a003