6533b86dfe1ef96bd12c9dc6

RESEARCH PRODUCT

Proposal of Up-to-Date Standards on Methods of Measuring Noise Parameters of Microwave Transistors

M. Sannino

subject

Data processingEngineeringNoise measurementbusiness.industryTransistorElectrical engineeringNoise figureLow-noise amplifierCharacterization (materials science)law.inventionNoiselawScattering parametersElectronic engineeringbusiness

description

One of the most interesting topics for microrwave community is the characterization of low-noise transistors. After so many years, the Standards suggested by IEEE in 1960 are considered obsolete by the experimenters. A new methodology is here proposed as a standard. To support this proposal, an original measuring system for the complete characterization of microwave transistors in terms of noise, gain and scattering parameters from noise figure measurements only is presented.

yearjournalcountryeditionlanguage
1994-12-0144th ARFTG Conference Digest
https://doi.org/10.1109/arftg.1994.327084