6533b86ffe1ef96bd12cce1d
RESEARCH PRODUCT
Optimal pareto solutions of a dynamic C chart: An application of statistical process control on a semiconductor devices manufacturing process
Toni LupoFilippo Sgroisubject
Dynamic C chartMultidisciplinaryStatistical process controlε-constraint methodMulti-objective designSemiconductor devices manufacturingdescription
The present paper proposes a novel economic-statistical design procedure of a dynamic c control chart for the Statistical Process Control (SPC) of the manufacturing process of semiconductor devices. Particularly, a non-linear constrained mathematical programming model is formulated and solved by means of the ε-constraint method. A numerical application is developed in order to describe the Pareto frontier, that is the set of optimal c charts and the related practical considerations are given. The obtained results highlight how the performance of the developed dynamic c chart overcome that of the related static one, thus demonstrating the effectiveness of the proposed procedure.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2015-01-01 |