6533b871fe1ef96bd12d1c51

RESEARCH PRODUCT

Creation of glass-characteristic point defects in crystalline SiO2 by 2.5 MeV electrons and by fast neutrons

Koichi KajiharaNadège OllierLinards SkujaKrisjanis Smits

subject

inorganic chemicalsLuminescenceMaterials science02 engineering and technologyCrystal structure01 natural sciencesMolecular physicsCrystal0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]Materials ChemistryElectron beam processingIrradiationDangling bonds[PHYS]Physics [physics]010302 applied physicstechnology industry and agricultureDangling bondElectron irradiationQuartz021001 nanoscience & nanotechnologyCondensed Matter PhysicsCrystallographic defectAmorphizationNeutron temperatureElectronic Optical and Magnetic MaterialsAmorphous solidCeramics and CompositesSilica glass0210 nano-technology

description

The support from M -ERANET project “MyND” is acknowledged. K.K. was partially supported by the Collaborative Research Project of Laboratory for Materials and Structures, Tokyo Institute of Technology . Visiting researcher support from Ecole Polytechnique, Palaiseau is appreciated. Mr. Olivier Cavani is thanked for the expert help with irradiations.

10.1016/j.jnoncrysol.2018.11.014http://dx.doi.org/10.1016/j.jnoncrysol.2018.11.014