6533b871fe1ef96bd12d228d
RESEARCH PRODUCT
Computation of the field diffracted by a local surface defect: application to tip–sample interaction in the photon scanning tunneling microscope
J. P. GoudonnetF. De FornelJean-claude Weebersubject
Electromagnetic fieldPhysicsDiffractionPhotonbusiness.industryPolarization (waves)Atomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsMagnetic fieldlaw.inventionsymbols.namesakeOpticsFourier transformlawsymbolsNear-field scanning optical microscopeComputer Vision and Pattern RecognitionScanning tunneling microscopebusinessdescription
We use a method based on the Fourier transform of the electromagnetic field to compute the field diffracted by a local deformation of a plane boundary surface. We give a complete development of each step of the technique. To show the interaction that exists between the probe of a near-field optical microscope and the observed sample, we use the model of a truncated cone-shaped tip above a rectangular surface defect. We compute the electrical intensity along a line located between the tip and the local surface defect. We show the influence of the polarization of the incident wave and the effect of the position of the tip with respect to the position of the surface defect.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-05-01 | Journal of the Optical Society of America A |