6533b872fe1ef96bd12d3795

RESEARCH PRODUCT

Study of plastic deformation modes in zirconium by color image analysis

F. BuyPierre GoutonC. VoltzA. Dussieux

subject

DiffractionZirconiumColour imageMaterials sciencebusiness.industryColor imageMetals and Alloyschemistry.chemical_elementSlip (materials science)Industrial and Manufacturing EngineeringComputer Science ApplicationsOpticschemistryModeling and SimulationCeramics and CompositesDeformation (engineering)Crystal twinningbusinessElectron backscatter diffraction

description

Abstract Twinning, as a deformation mode, is a complement to slip. This paper deals with the study from a qualitative point of view, as well as from a quantitative one. Besides techniques widely used in materials science studies such as electron backscattered diffraction (EBSD) or X-ray diffraction (XRD), colour image analysis technique are presented here. Its results manage to confirm or complete the ones obtained, thanks to others methods.

yearjournalcountryeditionlanguage
2004-11-01Journal of Materials Processing Technology
https://doi.org/10.1016/j.jmatprotec.2004.04.295