6533b873fe1ef96bd12d5f55

RESEARCH PRODUCT

PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction

subject

description

The potential of time-resolved photoemission electron microscopy (PEEM) for imaging ultrafast processes and for aberration correction in full-field imaging is discussed. In particular, we focus on stroboscopic imaging of precessional magnetic excitations via XMCD-PEEM exploiting the time structure of synchrotron radiation (magnetic field pulse pump–X-ray probe). In a special bunch-compression mode at BESSY, a time resolution of about 15 ps has been obtained. Further, we discuss an all-optical pump–probe technique using femtosecond laser excitation. A highly promising alternative to stroboscopic imaging is an approach using time-resolved image detection. As a second application of time-resolved PEEM we discuss potential ways of aberration correction. These approaches go back to the old ideas of Scherzer in the light of state-of-the-art equipment. The excellent time structure of synchrotron radiation or pulsed lasers along with advanced methods of time-resolved image detection and fast electronic pulsers opens ways for driving the resolution limit of a PEEM into the range of a few nanometers. Copyright © 2006 John Wiley & Sons, Ltd.