Search results for " Character"

showing 10 items of 1756 documents

Lithium silicate admixture in mortars to be used as putty for limestone

2018

Marble is a very common material in artworks for its softness, relative isotropy and homogeneity and its characteristic waxy look that gives "life" to sculptures. Even if in geology the term "marble" refers to metamorphosed limestone, commonly the term ‘marble’ is used more broadly encompassing hard unmetamorphosed limestone that can be polished assuming a glossy aspect. In the restoration field when marble artworks have cracks that alter the smoothness of their surface, a putty is used to fill them, for both aesthetic and conservative reasons. Putties usually consist of epoxy resin mixed with marble powder. The use of a synthetic resin raises some doubts on compatibility and durability of …

Settore ING-IND/22 - Scienza E Tecnologia Dei MaterialiCultural Heritage Materials Characterization Lithium SIlicate Marble putty
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The effect of Annealing Conditions on the Impedance and on the Photoelectrochemical behavior of TiO2 Nanotubes

2015

Titanium oxide nanotubes (NTs) have attracted much attention during last decade due to their special characteristics such as one-dimensional highly ordered geometry with large surface area and good chemical and optical stability.

Settore ING-IND/23 - Chimica Fisica ApplicataAnnealing Conditions Impedance and Photoelectrochemical characterizations TiO2 Nanotubes
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Fabrication and Characterization of Chitosan-Heteropolyacid complex as membranes for low temperature H2-O2 fuel cell

2015

In this work we describe an easy procedure to fabricate homogeneous CS-HPA polyelectrolyte films using phosphotungstic acid (PTA) as cross-linking agent. The re action between CS chains and PTA is controlled in order to allow fabricating PEC thin films, that can be easily peeled off from the support, cut to any size and shape, whose thickness can be controlled by setting reticulation and time and/or chitosan concentration

Settore ING-IND/23 - Chimica Fisica ApplicataFabrication and Characterization Chitosan-Heteropolyacid complex membranes low temperature H2-O2 fuel cell
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Fabrication and characterization of micrometer-scale ZnO memristors

2015

Memristors are an interesting class of resistive random access memory (RRAM) based on the electrical switching of metal oxide film resistivity . They are characterized for exhibiting resistive switching between a high-resistance state (HRS) and a low-resistance state (LRS) and have been recently considered as one of the most promising candidates for next-generation nonvolatile memory devices because of their low power consumption, fast switching operation, nondestructive readout, and remarkable scalability. The device structure is simply an oxide layer sandwiched between two metal electrodes. The switching behaviour is dependent both on the oxide material and the choice of metal electrodes.…

Settore ING-IND/23 - Chimica Fisica ApplicataFabrication and characterization micrometer-scale ZnO memristorsSettore ING-INF/01 - Elettronica
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Photoelectrochemical Characterization of Oxide Layers on 316L Stainless Steel Grown in High temperature Water

2014

Settore ING-IND/23 - Chimica Fisica ApplicataPhotoelectrochemical Characterization Oxide Layers on 316L Stainless Steel High temperature Water Nuclear Pressurized Water Reactor Corrosion
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Photoelectrochemical and XPS Characterization of Passive films Grown on 316L Stainless Steel in High Temperature Water

2015

One of the major materials challenge for continued safe, reliable and cost-effective utilization of watercooled nuclear reactors for electricity production is development of improved understanding of the synergistic fundamental mechanisms responsible for corrosion and stress corrosion cracking degradation of austenitic steels and nickel base alloys

Settore ING-IND/23 - Chimica Fisica ApplicataPhotoelectrochemical and XPS Characterization Passive films 316L Stainless Steel High Temperature Water
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Photoelectrochemical evidence of inhomogeneous composition at nm length scale of anodic films on valve metals alloys

2015

Anodic films of different thickness (∼30 nm and 70 nm) were grown by anodizing sputtering-deposited Ta-19at% Al to different formation voltages. N incorporation into the anodic films was inducing by performing the anodizing process in ammonium containing solutions. Layered anodic films were prepared by a double formation procedure with a first anodizing step in ammonium biborate solution and second anodizing step in borate buffer solution, or vice versa. Glow Discharge Optical Emission Spectroscopy was employed to show the distribution of N across the oxide. Photoelectrochemical measurements evidenced a red shift of the light absorption threshold due to N incorporation. A model was proposed…

Settore ING-IND/23 - Chimica Fisica ApplicataPhotoelectrochemical characterization nm length scale anodic films valve metals alloys
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Physico-chemical Characterization of Aluminium Oxide Films Grown on Etched Foils for Electrolytic Capacitors

2012

Settore ING-IND/23 - Chimica Fisica ApplicataPhysico-chemical CharacterizationAluminium Oxide FilmElectrolytic Capacitors
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Physico-chemical characterization of anodic films on sputter-deposited Al-Nb alloys.

2013

Settore ING-IND/23 - Chimica Fisica ApplicataPhysico-chemical characterization anodic films Al-Nb alloys
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Physicochemical Characterization of anodic film on Titanium prepared by Pedeferri’s Treatment.

2013

Settore ING-IND/23 - Chimica Fisica ApplicataPhysicochemical Characterization Photocurrent Spectroscopy Electrochemical Impedance Spectroscopy anodic film Titanium Pedeferri’s Treatment.
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