Search results for " Resolution"
showing 10 items of 1159 documents
Super-resolved Imaging based upon spatial depolarization of light
2010
In this paper we present a new approach allowing the surpassing of the diffraction based limitation for the achievable resolution provided by imaging systems. It is based on an encoding-decoding process of various spatial pixels or regions in the field of view of the imaged object by orthogonal and differently time varying polarization states. The reconstruction of the original spatial information is obtained by applying a decoding process in a way similar to the encoding one. Although all the spatial information is summed and mixed together by the system, the decoding provides super resolved imaging since in every spatial position the undesired spatial information having time varying polar…
Super-resolved imaging with randomly distributed, time- and size-varied particles
2009
In this paper we present a super-resolved approach aimed at overcoming the diffraction limit in imaging systems. It is based on place randomly and time-varied particles having different sizes on the top of the sample. By considering particle sizes smaller than the object's minimum detail that an imaging system can resolve, it is possible to recover a high resolution image from a set of low resolution images while before capturing each image we produce a randomly modified distribution of the particles by vibrating the sample. The simulation process as well as experimental results validates the proposed approach that includes effectively decreasing the F number of the imaging system while bei…
Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…
2016
Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…
Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by Hard X-ray synchrotron nanoprobes
2019
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary hard X-ray synchrotron techniques at the nanoscale have been applied to the study of individual nanowires (NWs) containing non-polar GaN/InGaN multi-quantum-wells. The trace elemental sensitivity of X-ray fluorescence allows one to determine the In concentration of the quantum wells and their inhomogeneities along the NW. It is also possible to rule out any contamination from the gold nanoparticle …
Non-Homogeneity of Lateral Resolution in Integral Imaging
2013
We evaluate the lateral resolution in reconstructed integral images. Our analysis takes into account both the diffraction effects in the image capture stage and the lack of homogeneity and isotropy in the reconstruction stage. We have used Monte Carlo simulation in order to assign a value for the resolution limit to any reconstruction plane. We have modelled the resolution behavior. Although in general the resolution limit increases proportionally to the distance to the lens array, there are some periodically distributed singularity planes. The phenomenon is supported by experiments.
High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite
2019
New journal of physics 21(11), 113031 - (2019). doi:10.1088/1367-2630/ab51fe
Geometrical super resolved lensless imaging
2011
In the field of super resolution researchers are trying to overcome both the diffraction as well as the geometrical bounds of an imaging system. In this paper we present a recently developed approach that aims to overcome the geometrical bounds while using a unified spatial light modulator (SLM) based lensless configuration.
Super-resolved or field of view enlarged imaging based upon spatial depolarization of light
2010
Abstract In this paper we present a new approach allowing the surpassing of the diffraction based limitation for the achievable resolution provided by imaging systems. It is based on an encoding–decoding process of various spatial pixels or regions in the field of view of the imaged object by orthogonal and differently time varying polarization states. The reconstruction of the original spatial information is obtained by applying a decoding process in a way similar to the encoding one. Although all the spatial information is summed and mixed together by the system, the decoding provides super-resolved imaging since in every spatial position the undesired spatial information having time vary…
Superesolution in digital holographic microscopy
2011
In this contribution, we address with the possibility to overcome the limited resolving power of imaging systems beyond the limit imposed by Abbe's diffraction theory. We first review the mathematical foundations underlying superresolution (SR) from an information theory point of view and then we focus on two multiplexing approaches in digital holographic microscopy (DHM) for achieving SR by synthetic aperture (SA) generation.
Transverse resolution improvement using rotating-grating time-multiplexing approach
2008
The ability to improve the limited resolving power of optical imaging systems while approaching the theoretical diffraction limit has been an attractive discipline with growing interest over the last years due to its benefits in many applied optics systems. This paper presents a new approach to achieve transverse superresolution in far-field imaging systems, with direct application in both digital microscopy and digital holographic microscopy. Theoretical analysis and computer simulations show the validity of the presented approach.