Search results for " Scanning"

showing 10 items of 988 documents

3D part inspection path planning of a laser scanner with control on the uncertainty

2011

International audience; This article concerns the measurement process of mechanical parts using laser scanners. From the point of view of industrial applications, the objective is to guarantee the measurement accuracy during the scanning with regard to the geometrical product specifications. The proposed method can be summarized as follow: the first step consists of analyzing the interval of tolerance for the different specifications and to attribute to every geometrical entity a maximal uncertainty of measurement. This uncertainty depends on the angle of incidence between the laser plane and the scanned surface. In the second step, an approach based on the concept of visibility is used fro…

[ SPI.MECA.GEME ] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]0209 industrial biotechnologyEngineeringLaser scanningPoint cloud[PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]02 engineering and technologyInterval (mathematics)01 natural sciencesIndustrial and Manufacturing Engineeringthree-dimensional inspectionlaser sensor010309 optics020901 industrial engineering & automation0103 physical sciencesComputer visionPoint (geometry)Motion planninguncertainties of measurementbusiness.industryscanning pathVisibility (geometry)visibilityComputer Graphics and Computer-Aided DesignComputer Science ApplicationsMetrology[SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph][ PHYS.MECA.GEME ] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]Measurement uncertaintyArtificial intelligencebusiness
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3D Displacements and Strains Solid Measurement based on the Surface Texture with a Scanner Laser

2013

International audience; The developments of non-contact measurement are today widely due to the unprecedented progress of optronic. The applications of these techniques are wide and varied for the 3D measurement of industrial products. In addition to the forms and dimensions, we show in this paper that the devices of laser scanning permit to measure displacements and deformations. In this case, it is necessary to follow a solid particle in its motion. It is then necessary to identify the particle between two configurations of the body before and after displacement. The method of greyscale patterns, obtained by applying a spray, is generally used. The originality of the proposed method is ba…

[ SPI.MECA.GEME ] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]0209 industrial biotechnologyScannerMaterials scienceLaser scanningPoint cloud[PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]02 engineering and technologySurface finishMetrology01 natural sciencesGrayscaleDisplacement (vector)010309 optics020901 industrial engineering & automation0103 physical sciencesPoint (geometry)Computer vision3D strain measurementLaser scanningGeneral Environmental SciencePixelbusiness.industry[SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph][ PHYS.MECA.GEME ] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]General Earth and Planetary SciencesArtificial intelligencebusinessProcedia CIRP
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3D digitizing path planning for part inspection with laser scanning

2007

If the first work relating to the automation of the digitalization of machine elements goes back to approximately 25 years, the process of digitalization of parts with non-contact sensor remains nevertheless complex. It is not completely solved today, in particular from a metrological point of view. In this article, we consider the determination of the trajectory planning within the framework of the control of dimensional and geometrical specifications. The sensor used in this application is a laser planner scanner with CCD camera oriented and moved by a CMM. For this purpose, we have focused on the methodology used to determine the best possible viewpoints which will satisfy the digitizing…

[ SPI.MECA.GEME ] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]Engineering drawingEngineeringLaser scanningbusiness.industry[PHYS.MECA.GEME] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]Visibility (geometry)Process (computing)AutomationSet (abstract data type)Chart[ PHYS.MECA.GEME ] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph]Point (geometry)Computer visionMotion planningArtificial intelligence[SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]businessEighth International Conference on Quality Control by Artificial Vision
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Strain fields measurement of non-rigid solid by scanning laser coupled with camera

2013

International audience; Abstract. Today, the techniques of measurement without contact by scanning laser are increasingly used. These techniques allow to measure 3D objects without contact and the measurement rates can reach few thousand points by second that is very adapted to complex shapes. To measure displacements and deformations, it is necessary to follow a solid particle in its motion between two configurations of the body before and after displacement. The method of stereovision based on grayscale patterns, obtained by applying a spray, is generally used. The results are obtained by two correlations: spatial and temporal correlations. An alternative method consists to use a scanner …

[ SPI.MECA.GEME ] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]ScannerLaser scanningComputer sciencePoint cloudelastic Body02 engineering and technology01 natural sciencesGrayscaleDisplacement (vector)law.invention010309 optics0203 mechanical engineeringlawPosition (vector)0103 physical sciencesComputer visionstrain measurement[SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]Scanner Laserbusiness.industryLaser[SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]020303 mechanical engineering & transportsArtificial intelligenceCubebusiness
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Automation of Acquisition and Post-processing for 3D Digitalisation

2009

The automation of digitalisation is an indispensable step in the development of 3D measuring, in various fields :- in industry, to accelerate the procedures for control of parts,- in archaeology and biology, for the study of collections of several hundreds even thousand objects (for which the acquisition is for the moment impossible because of necessary time, and thus of the cost). In this thesis, we explain first the various existing systems of acquisition and positioning, by detailing the advantages and the inconveniences of every system. We present then the developed methodology to guide the operator in these choices as well as the tool set up to formalize this methodology. Then we will …

[INFO.INFO-OH] Computer Science [cs]/Other [cs.OH]planification de vues[INFO.INFO-OH]Computer Science [cs]/Other [cs.OH]view planning[ INFO.INFO-OH ] Computer Science [cs]/Other [cs.OH]automatisation3D scanningNext-Best-Viewautomationnumérisation 3D
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Near-field spectroscopy of low-loss waveguide integrated microcavities

2006

International audience; A scanning near-field spectroscopy method is used to observe loss reduction and Q-factor enhancement due to transverse-mode profile matching within photonic-crystal microcavities. Near-field measurements performed directly on cavity modes are compared with three-dimensional calculations and quantitative agreement is observed. (c) 2006 American Institute of Physics.

[PHYS.PHYS.PHYS-AO-PH]Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]Materials sciencePhysics and Astronomy (miscellaneous)business.industryPhotonic integrated circuitPhysics::OpticsNear and far field01 natural sciencesWaveguide (optics)010309 opticsOptics[ PHYS.PHYS.PHYS-AO-PH ] Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]Q factor0103 physical sciencesOptoelectronicsNear-field scanning optical microscope010306 general physicsbusinessSpectroscopyMicrophotonicsPhotonic crystalApplied Physics Letters
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Theoretical principles of near-field optical microscopies and spectroscopies

2000

International audience; This paper deals with the principles of detection of optical signals near a surface in a manner permitting the mapping of the distribution of the fields close to various kinds of illuminated samples. We begin with a discussion of the main physical properties of the optical fields near a surface in the absence of any probe tip. This mainly concerns phenomena involving evanescent waves for which the local decay lengths are governed not only by the sizes but also by the intrinsic properties of the surface structures. The interpretation of the detection process is reviewed on the basis of a discussion about the possibility of establishing direct comparisons between exper…

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]ELECTRODYNAMICSEvanescent wavePOLARIZATIONGeneral Physics and AstronomyNear and far field02 engineering and technology01 natural scienceslaw.inventionSCANNING TUNNELING MICROSCOPESINGLE MOLECULESsymbols.namesakeOpticslaw0103 physical sciencesSCATTERINGPhysical and Theoretical ChemistryFLUORESCENCE010306 general physicsPhysics[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]SURFACE-STRUCTURESLocal density of statesLIGHT CONFINEMENT[ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]SELF-CONSISTENTbusiness.industryScattering021001 nanoscience & nanotechnologyPolarization (waves)Maxwell's equationsRESOLUTIONsymbolsNear-field scanning optical microscopeScanning tunneling microscope0210 nano-technologybusiness
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SNOM signal near plasmonic nanostructures: an analogy with fluorescence decays channels

2008

International audience; Scanning Near-field Optical Microscope (SNOM) is based on local excitations of nanostructures deposited on a substrate (illumination mode). Ideally, the local source behaves like a dipolar emitter so that the SNOM signal is strongly similar to the fluorescence decay rates of an excited molecule that would be located at the SNOM tip position. We present here how the SNOM signal near plasmonic nanostructures can be used to analyze radiative and non-radiative contribution to the fluorescence decay rate.

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]HistologyMaterials science[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsPhysics::Optics02 engineering and technologySubstrate (electronics)01 natural sciencesSignalPathology and Forensic Medicinelaw.inventionGOLD NANORODSplasmonOpticsOptical microscopelaw0103 physical sciencesRadiative transferMODE[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physicsPlasmon[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics][ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]business.industryGreen's dyadic021001 nanoscience & nanotechnologyFluorescenceSantennaDENSITY[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsNear-field scanning optical microscopeNanorod[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonicfluorescence decay rateSNOM0210 nano-technologybusiness
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Far-field imaging of the electromagnetic local density of optical states.

2008

International audience; We introduce a new experimental method to measure the local electromagnetic density of states (LDOS) by integrating the differential scattering cross section. The signal detected essentially reflects the intrinsic scattering response of the photonic structures and renders the partial LDOS dominated by evanescent modes. We give a theoretical understanding of the LDOS image formation and show a qualitative agreement between experimental images and theoretical maps. This approach can be practically applied to the direct measurement of an optical antenna's scattering efficiency and can provide valuable information for designing optimum structures utilized in radiative de…

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]Image formationDYNAMICS[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsPhysics::OpticsNear and far field02 engineering and technology01 natural sciencesSignal010309 opticsOptics[ PHYS.COND.CM-MSQHE ] Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]0103 physical sciences[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]Photonic crystalPhysics[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics][ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]SPECTROSCOPYbusiness.industryScatteringSURFACE-PLASMONSPONTANEOUS EMISSIONMICROSCOPY021001 nanoscience & nanotechnologyAtomic and Molecular Physics and Optics[PHYS.COND.CM-MSQHE] Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]Density of states[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicNear-field scanning optical microscope[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / PhotonicPhotonics0210 nano-technologybusinessOptics letters
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Near-field observation of subwavelength confinement of photoluminescence by a photonic crystal microcavity

2006

We present a direct, room-temperature near-field optical study of light confinement by a subwavelength defect microcavity in a photonic crystal slab containing quantum-well sources. The observations are compared with three-dimensional finite-difference time-domain calculations, and excellent agreement is found. Moreover, we use a subwavelength cavity to study the influence of a near-field probe on the imaging of localized optical modes. © 2006 Optical Society of America.

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]Materials sciencePhotoluminescencePhysics::OpticsNear and far field02 engineering and technology01 natural scienceslaw.inventionScanning probe microscopy020210 optoelectronics & photonicsOpticslaw0103 physical sciences0202 electrical engineering electronic engineering information engineering010306 general physicsComputingMilieux_MISCELLANEOUSPhotonic crystal[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]Total internal reflection[ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]business.industryNear-field opticsOpticsOptical microcavityAtomic and Molecular Physics and OpticsOCIS codes: 230.0230 180.5810 250.5230OptoelectronicsNear-field scanning optical microscopebusiness
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