Search results for " diffraction"
showing 10 items of 896 documents
Synthesis and characterization of ZnO nano and micro structures grown by low temperature spray pyrolysis and vapor transport.
2012
In this work we present a systematic study of ZnO micro and nanostructures grown by spray pyrolysis (SP) and by physical vapour transport (PVT) on glass and c-sapphire substrates at low temperatures. Optimised growth conditions have allowed to obtain homogeneous ZnO nanolayers composed of quasi-spherical nanoparticles in the range 2 to 8 nm by spray pyrolysis, while by PVT the selected growth conditions allow to produce a wide variety of morphologies (tripods, grains, arrows and wires) of nano and microsize dimension. Grazing incidence X-ray diffraction, field emission scanning electron microscopy (FE-SEM), high resolution transmission electron microscopy (HRTEM), selected area electron dif…
X-ray diffraction line-broadening study on two vibrating, dry-milling procedures in kaolinites
2009
Due to the great technological importance of the microstructure of kaolinite, characterizing its evolution during dry milling of kaolin and analyzing the microstructural information obtained from different methods were the main aims of this work. The microstructural alteration of kaolinite is evaluated by X-ray diffraction and electron microscopy methods, comparing the results obtained and analyzing the correlations between them. The Warren-Averbach and Voigt-function methods of X-ray diffraction microstructural analysis have been applied successfully to the study of the effects of two different, vibrating-cup dry-milling configurations in the microstructure of kaolinite from the reflection…
Defects at the TiO2(100) surface probed by resonant photoelectron diffraction.
2006
We report photoelectron diffraction (PED) experiments of weakly sub-stoichiometric TiO 2 (100) rutile surfaces. Apart from standard core-level PED from the Ti-2p3/2 line, we have studied valence band PED from the defect induced Ti-3d states in the insulating band gap. For maximum yield, the latter were resonantly excited at the Ti-2p absorption edge. The PED patterns have been analyzed within the forward scattering approximation as well as by comparison with simulated PED patterns obtained in multiple scattering calculations. The analysis shows that the defect induced Ti-3d charge is mainly located on the second layer Ti atoms. © 2007 Elsevier B.V. All rights reserved.
Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.
1987
This paper reports investigations of ZnS quasi-amorphous films by electroreflectance (ER). The films were produced by thermal evaporation and their structure determined by electron diffraction. A voltage Vo cos cut was applied through the film with two evaporated Al electrodes. A lock-in amplifier gave 2 signals, Sf at f=ω/2π frequency and S2f at 2f frequency. The S2f spectrum, characteristic of the centrosymmetric bulk component of the film, reveals tails of localized states typical of amorphous semi-conductors. The Sf spectrum, characteristic of the interface layers with broken centro-symmetry, reveals tails of impurity levels which we attributed to diffusion of the electrode metal into t…
128-Channel Silicon Strip Detector Installed at a Powder Diffractometer
2004
Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker…
Controlling the Formation of Sodium/Black Phosphorus IntercalationCompounds Towards High Sodium Content
2021
The solid-state synthesis of pure sodium-black phosphorus intercalation compounds (Na-BPICs) has been optimized in bulk for two stoichiometric ratios. Specifically, in-situ X-Ray diffraction (XRD) allowed the precise identification of the optimal temperature range for the formation of Na-BPICs: 94°C–96°C. Moreover, as the undesired formation of Na3P takes place at this very same range, we succeeded in introducing a new synthetic route based on a fast-thermal ball milling implementation that results in the bulk production of BPIC without Na3P in 9 out of 10 cases. Finally, by combining XRD, Raman spectroscopy, and DFT calculations we developed a new structural model for Na-based BPICs showin…
COMPARING PARTICLE SIZE DISTRIBUTION ANALYSIS BY SEDIMENTATION AND LASER DIFFRACTION METHOD
2009
In this paper a brief review of the laser diffraction method is firstly carried out. Then, for 30 soil samples having a different texture classification sampled in Sicilian basin, a comparison between the two techniques is developed. The analysis demonstrated that the sand content measured by Sieve-Hydrometer method can be assumed equal to the one determinated by laser diffraction technique while an overestimation of the clay fraction measured by Sieve-Hydrometer method respect to laser diffraction technique was obtained. Finally a set of equations useful to refer LD measurements to SH method was proposed.
Towards automated diffraction tomography. Part II--Cell parameter determination.
2008
Automated diffraction tomography (ADT) allows the collection of three-dimensional (3d) diffraction data sets from crystals down to a size of only few nanometres. Imaging is done in STEM mode, and diffraction data are collected with quasi-parallel beam nanoelectron diffraction (NED). Here, we present a set of developed processing steps necessary for automatic unit-cell parameter determination from the collected 3d diffraction data. Cell parameter determination is done via extraction of peak positions from a recorded data set (called the data reduction path) followed by subsequent cluster analysis of difference vectors. The procedure of lattice parameter determination is presented in detail f…
NUMERICAL-EXPERIMENTAL METHOD FOR THE ANALYSIS OF RESIDUAL STRESSES IN COLD-EXPANDED HOLES
2012
Hole cold expansion is a technique widely used to improve the fatigue life of components with holes, e.g. bolted or riveted joints. As it has been demonstrated in literature by analytical, numerical and experimental analyses carried out by several authors, the compressive residual stresses introduced by the hole cold expansion have a beneficial influence on both the static and the fatigue strength of the treated component, because they reduce significantly the typical stress peaks around the hole due to stress concentration. In the literature, various analyses of the residual stresses introduced by the hole cold expansion have been performed by using several methods such as X-ray diffractio…
Dispersion-compensated Lau-like processor
2004
We present a diffractive lens-based optical assembly with which to achieve high-contrast Lau-like interferential fringes with totally incoherent illumination.