Search results for "Aperture"
showing 10 items of 182 documents
Optical quality comparison among different Boston contact lens materials.
2014
BACKGROUND The aim was to assess the optical quality of four Boston contact lens materials with an optical device based on Schlieren interferometry. METHODS The NIMO TR1504 (Lambda-X, Nivelles, Belgium) was used to measure higher-order aberrations and their corresponding root mean square values of four different rigid gas permeable contact lenses made from four different Boston materials: EO, ES, XO and XO2 . For each lens, 30 measurements were performed with two optical apertures: 3.0 mm and 6.0 mm. The modulation transfer function, point spread function, Strehl ratio and a simulation of the image provided by the lens were computed from the Zernike coefficients measured up to the fourth or…
Near-Field Distribution of Optical Transmission of Periodic Subwavelength Holes in a Metal Film
2000
Recent experimental discovery of the enhanced optical transmission through metal films with periodic subwavelength holes has given rise to a considerable interest in the optical properties of such structures due to their possible numerous applications in optics and optoelectronics as well as rich physics behind the phenomenon of the transmission enhancement [1–4]. The transmission of a subwavelength aperture is very low and proportional to the fourth power of the ratio of its diameter and light wavelength. However, if a metal film is perforated with a periodic array of such holes, the optical transmission can be significantly enhanced [1]. Being normalized to the total area of the illuminat…
Single molecule imaging using a highly confined optical field at a triangular aperture
2005
We demonstrate that scanning near-field optical microscopy based on a probe with a triangular aperture is capable of imaging single fluorescent molecules with an optical resolution of 30 nm. Numerical simulations agree well with experiment.
Texturing of Indium Phosphide for Improving the Characteristics of Space Solar Cells
2021
This paper discusses and demonstrates the usefulness and prospects of using textured layers of indium phosphide as a material for space solar cells. Such designs improve the performance of the photovoltaic converter by increasing the effective area and surface roughness. Thus, it minimizes the background reflectivity of the surface. Textured layers on the InP surface were obtained by electrochemical etching using a bromous acid solution.
Aperture-edge scattering in MeV ion-beam lithography. II. Scattering from a rectangular aperture
2009
The capability of collimators to define beams of MeV ions with sub-100nm dimensions has recently been demonstrated. Such nanometer beams have potential applications in MeV ion-beam lithography, which is the only maskless technique capable of producing extremely high aspect-ratio micro- and nanostructrures, as well as in high resolution MeV ion-beam imaging. Ion scattering from the collimator edges can be a resolution-restricting factor in these applications. Scattering processes at edges are difficult to study using conventional simulation codes because of the complicated geometry. In this part of our work, the authors used the GEANT4 toolkit as a simulation tool for studying the behavior o…
Ultrasonic phased array inspection of wire plus arc additive manufacture samples using conventional and total focusing method imaging approaches
2019
In this study, three aluminium samples produced by wire + arc additive manufacture (WAAM) are inspected using ultrasonic phased array technology. Artificial defects are machined using a centre drill, ø 3 mm, and electrical discharge machining (EDM), ø 0.5-1 mm, in a cylindrical through-hole topology. The samples are first inspected using a single-element wheel probe mounted on a KUKA robot in order to investigate the feasibility of using a conventional ultrasonic transducer approach. Unfortunately, the wheel probe is found to be unsuitable for scanning the WAAM specimens and ultrasonic phased arrays are employed next. The set-up includes 5 MHz and 10 MHz arrays (128 elements) in direct cont…
Direct Writing of Channels for Microfluidics in Silica by MeV Ion Beam Lithography
2011
The lithographic exposure characteristic of amorphous silica (SiO2) was investigated for 6.8 MeV16O3+ions. A programmable proximity aperture lithography (PPAL) technique was used for the ion beam exposure. After exposure, the exposed pattern was developed by selective etching in 4% v/v HF. Here, we report on the development of SiO2in term of the etch depth dependence on the ion fluence. This showed an exponential approach towards a constant asymptotic etch depth with increasing ion fluence. An example of microfluidic channels produced by this technique is demonstrated.
Sensitivity analysis on the relationship between vegetation growth and multi-polarized radar data
2009
Spatially distributed soil moisture is required for watershed applications such as drought and flood prediction, crop irrigation scheduling, etc. In particular, an accurate assessment of the spatial and temporal variation of soil moisture is necessary to improve the predictive capability of runoff models, and for improving and validating hydrological processes forecasting. In recent years, several models have been developed in order to retrieve soil moisture using RADAR data. However, these models need precise prior knowledge about surface roughness. Within this framework, the present research aims to investigate the capabilities of multi polarimetric RADAR images to overcome the use of in …
Enhanced viewing-angle integral imaging by multiple-axis telecentric relay system
2009
One of the main limitations of integral imaging is the narrow viewing angle. This drawback comes from the limited field of view of microlenses during the pickup and display. We propose a novel all-optical technique which allows the substantial increase of the field of view of any microlens and therefore of the viewing angle of integral-imaging displays.
Large Depth-of-Field Integral Microscopy by Use of a Liquid Lens
2018
Integral microscopy is a 3D imaging technique that permits the recording of spatial and angular information of microscopic samples. From this information it is possible to calculate a collection of orthographic views with full parallax and to refocus computationally, at will, through the 3D specimen. An important drawback of integral microscopy, especially when dealing with thick samples, is the limited depth of field (DOF) of the perspective views. This imposes a significant limitation on the depth range of computationally refocused images. To overcome this problem, we propose here a new method that is based on the insertion, at the pupil plane of the microscope objective, of an electrical…