Search results for "Atomic force microscopy"

showing 10 items of 208 documents

Organic fractal nano-dimensional structures based on fullerene C60

2019

The ways for a synthesis of nanoporous and close-packed types of fullerene C60 aggregates in two-component organic solvents (toluene + tetrahydrofuran) were established as well as their structural ...

FullereneMaterials scienceAtomic force microscopyNanoporousOrganic Chemistry02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and Optics0104 chemical sciencesSolventFractalChemical engineeringNano-General Materials SciencePhysical and Theoretical Chemistry0210 nano-technologyFullerenes, Nanotubes and Carbon Nanostructures
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Synthesis of polymer materials for use as cell culture substrates

2007

International audience; Up to today, several techniques have been used to maintain cells in culture for studying many aspects of cell biology and physiology. More often, cell culture is dependent on proper anchorage of cells to the growth surface. Thus, poly-L-lysine, fibronectin or laminin are the most commonly used substrates. In this study, electrosynthesized biocompatible polymer films are proposed as an alternative to these standard substrates. The electrosynthesized polymers tested were polyethylenimine, polypropylenimme and polypyrrole. Then, the adhesion, proliferation and morphology of rat neuronal cell lines were investigated on these polymer substrates in an attempt to develop ne…

General Chemical EngineeringCellular differentiationNanotechnology02 engineering and technologyCell morphologylaw.invention03 medical and health scienceschemistry.chemical_compoundConfocal microscopylaw[CHIM]Chemical Sciencespolymers030304 developmental biology0303 health sciencesPolyethyleniminecell culture[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]atomic force microscopybiologyCell growthneurosciencesmicrosystemAdhesion021001 nanoscience & nanotechnologyFibronectinchemistryelectrochemistryCell culturebiology.proteinBiophysics0210 nano-technology
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Application of graphene quantum dots in heavy metals and pesticides detection

2020

Graphene Quantum Dots (GQDs) were produced using electrochemical oxidation of graphite rods. Obtained GQDs were gamma-irradiated in the presence of the N atoms source, ethylenediamine. Both structural and morphological changes were investigated using UV-Vis, X-ray photoelectron and photoluminescence (PL) spectroscopy as well as atomic force microscopy. The ability of both types of dots to change PL intensity in the presence of pesticides such as malathion and glyphosate, as well as copper (II) ions was detected. These preliminary results indicated a high potential of produced GQDs to be applied as non-enzymatic PL sensors for the detection of selected pesticides and metal ions. 26th Interna…

Graphene Quantum DotsX-ray photoelectron spectroscopymalathionatomic force microscopyphotoluminescence sensorsUV-Vis spectroscopycopper (II) ionglyphosatephotoluminescence spectroscopyGraphene Quantum Dotelectrochemical oxidationethylenediaminecopper (II) ionsgraphite rodgraphite rods
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Molecular arrangement between multivalent glycocluster andPseudomonas aeruginosaLecA (PA-IL) by atomic force microscopy: influence of the glycocluste…

2013

New therapeutics strategy against cystic fibrosis seeks to prevent the adhesion of the bacterium Pseudomonas aeruginosa (PA) on the epithelial cells in the lungs. One of the factors that induces the adhesion is the interaction between natural glycocluster present on the cells and lectins such as the PA lectin LecA (PA-IL) present on the bacterium. By introducing synthetic glycoclusters with a great affinity with the lectin PA-IL, the adhesion can be prevented. In this study, we characterized, by atomic force microscopy, the interaction between a tetra-galactosylated glycocluster and the PA-IL lectin for high concentration of lectins (2.5 μM).We showed that the strong lectin/lectin interacti…

High concentration0303 health sciencesAtomic force microscopyPseudomonas aeruginosaLectinAdhesionBiology010402 general chemistrymedicine.disease_cause01 natural sciences0104 chemical sciences03 medical and health sciencesBiochemistryStructural Biologybiology.proteinmedicineMolecular BiologyVolume concentration030304 developmental biologyJournal of Molecular Recognition
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2019

Atomic force microscopy (AFM) is today an established tool in imaging and determination of mechanical properties of biomaterials. Due to their complex organization, those materials show intricate properties such as viscoelasticity. Therefore, one has to consider that the loading rate at which the sample is probed will lead to different mechanical response (properties). In this work, we studied the dependence of the mechanical properties of endothelial cells on the loading rate using AFM in force spectroscopy mode. We employed a sharp, four-sided pyramidal indenter and loading rates ranging from 0.5 to 20 μm/s. In addition, by variation of the load (applied forces from 100 to 10,000 pN), the…

HistologyMaterials scienceAtomic force microscopyWork (physics)Force spectroscopy030206 dentistry02 engineering and technology021001 nanoscience & nanotechnologyViscoelasticity03 medical and health sciencesMedical Laboratory Technology0302 clinical medicineIndentationMechanical properties of biomaterialsLoading rateAnatomyComposite material0210 nano-technologyInstrumentationCell mechanicsMicroscopy Research and Technique
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Scanning probe microscopies applied to the study of the domain wall in a ferroelectric crystal.

2007

Summary Scanning near-field optical microscopy is capable of measuring the topography and optical signals at the same time. This fact makes this technique a valuable tool in the study of materials at nanometric scale and, in particular, of ferroelectric materials, as it permits the study of their domains structure without the need of chemical etching and, therefore, not damaging the surface (as will be demonstrated later). We have measured the scanning near-field optical microscopy transmission, as well as the topography, of an RbTiOPO4 single crystalline slab, which exhibits two different of macroscopic ferroelectric domains. A chemical selective etching has been performed to distinguish b…

HistologyMaterials sciencebusiness.industryScanning confocal electron microscopyScanning capacitance microscopyIsotropic etchingPathology and Forensic MedicinePiezoresponse force microscopyOpticsScanning ion-conductance microscopyNear-field scanning optical microscopebusinessNon-contact atomic force microscopyVibrational analysis with scanning probe microscopyJournal of microscopy
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Anomalous behaviour of periodic domain structure in Gd-doped LiNbO3single crystals

2007

Atomic force microscopy studies of etching patterns, stability of regular domain structure, and anomalies of electrical characteristics in the 300 - 385 K range of a series of Gddoped lithium niobate single crystals grown under equal conditions are reported.

HistoryRange (particle radiation)Materials scienceCondensed matter physicsAtomic force microscopyLithium niobateDopingStructure (category theory)Computer Science ApplicationsEducationchemistry.chemical_compoundCrystallographychemistryEtching (microfabrication)Domain (ring theory)Journal of Physics: Conference Series
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Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

2016

Contacts with MoS2 are currently the object of many investigations, since current injection through metal/MoS2 interfaces represents one of the limiting factors to the performance of MoS2 thin film transistors. In this paper, we employed conductive atomic force microscopy (CAFM) to investigate the current injection mechanisms from a nanometric contact (a Pt coated tip) to the surface of MoS2 thin films exfoliated on SiO2. The analysis of local current-voltage (I-V) characteristics on a large array of tip positions provided high spatial resolution information on the lateral homogeneity of the tip/MoS2 Schottky barrier Phi(B) and of the ideality factor n. From the histograms of the measured P…

Ideality factorMaterials scienceConductive atomic force microscopySchottky barrierAnalytical chemistryCondensed Matter Physic02 engineering and technology01 natural sciencesStandard deviation0103 physical sciencesHomogeneity (physics)General Materials ScienceThin filmSchottky barrierNanoscopic scaleDiode010302 applied physicsbusiness.industryMechanical EngineeringSettore FIS/01 - Fisica SperimentaleConductive atomic force microscopy021001 nanoscience & nanotechnologyCondensed Matter PhysicsMechanics of MaterialsThin-film transistorOptoelectronicsMaterials Science (all)0210 nano-technologybusinessMoS2
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Elasticity and yield strength of pentagonal silver nanowires: In situ bending tests

2014

This paper reports in situ mechanical characterization of silver nanowires (Ag NWs) inside a scanning electron microscope using a cantilevered beam bending technique. Measurements consisted in controlled bending of a cantilevered NW by the tip of an atomic force microscope glued to the force sensor. Relatively high degree of elasticity followed by either plastic deformation or fracture was observed in bending experiments. Experimental data were numerically fitted into the model based on the elastic beam theory and values of Young modulus and yield strength were extracted. Measurements were performed on twenty Ag NWs with diameters from 76 nm to 211 nm. Average Young modulus and yield streng…

In situCantileverMaterials scienceAtomic force microscopyScanning electron microscopeYoung's modulusSilver nanowiresCondensed Matter Physicslaw.inventionsymbols.namesakelawsymbolsGeneral Materials ScienceElectron microscopeElasticity (economics)Composite materialMaterials Chemistry and Physics
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Tribological Aspects of In Situ Manipulation of Nanostructures Inside Scanning Electron Microscope

2014

This chapter is dedicated to manipulation of nanostructures inside a scanning electron (SEM) microscope employed for real-time tribological measurements. Different approaches to force registration and calculation of static and kinetic friction are described. Application of the considered methodology to Au and Ag nanoparticles, as well as ZnO and CuO nanowires, is demonstrated. Advantages and limitations of the methodology in comparison to traditional AFM-based manipulation techniques are discussed.

In situKinetic frictionMaterials scienceNanostructureMicroscopeScanning electron microscopeAtomic force microscopylawNanowireNanotechnologyTribologylaw.invention
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