Search results for "Backscatter"

showing 10 items of 123 documents

Influence of the microstructure on the corrosion behaviour of low-carbon martensitic stainless steel after tempering treatment

2014

Abstract The microstructure of grade X4CrNiMo16.5.1 stainless steel was studied at different scales. The chemical composition of the native passive film formed on the different phases was then determined at the microscale. The degree of homogeneity of the native passive film is discussed. Subsequently, the susceptibility to pitting corrosion of X4CrNiMo16.5.1 was quantified using the electrochemical microcell technique. The nature of precursor sites and the morphology of pits were investigated by combining scanning electron microscopy with Electron BackScatter Diffraction and potentiostatic pulse tests. The role of the microstructure and the cold-worked layer generated by polishing in pitti…

Materials scienceScanning electron microscopeGeneral Chemical EngineeringMetallurgyPolishingGeneral ChemistryMartensitic stainless steelengineering.materialMicrostructureCorrosionengineeringPitting corrosionGeneral Materials ScienceTemperingElectron backscatter diffractionCorrosion Science
researchProduct

Corrosion behaviour of heavily deformed pearlitic and brass-coated pearlitic steels in sodium chloride solutions

2014

Abstract The influence of plastic deformation and galvanic coupling on the microstructure and corrosion behaviour of pearlitic steel and brass-coated pearlitic steel was investigated in sodium chloride solution at 25 °C. Microstructural changes were quantified using scanning electron microscopy coupled with EBSD. Chemical and electrochemical modifications were evaluated using XPS, ZRA, the electrochemical microcell technique and the weight loss method. From these experiments, the influence of microstructural changes on the electrochemical parameters and the corrosion rate was discussed.

Materials scienceScanning electron microscopeGeneral Chemical EngineeringSodiumMetallurgychemistry.chemical_elementGeneral ChemistryElectrochemistryMicrostructureCorrosionBrassX-ray photoelectron spectroscopychemistryvisual_artvisual_art.visual_art_mediumGeneral Materials ScienceElectron backscatter diffractionCorrosion Science
researchProduct

Calibration of a thermoluminescent dosimeter worn over lead aprons in fluoroscopy guided procedures

2018

Fluoroscopy guided interventional procedures provide remarkable benefits to patients. However, medical staff working near the scattered radiation field may be exposed to high cumulative equivalent doses, thus requiring shielding devices such as lead aprons and thyroid collars. In this situation, it remains an acceptable practice to derive equivalent doses to the eye lenses or other unprotected soft tissues with a dosimeter placed above these protective devices. Nevertheless, the radiation backscattered by the lead shield differs from that generated during dosimeter calibration with a water phantom. In this study, a passive personal thermoluminescent dosimeter (TLD) was modelled by means of …

Materials scienceeye lens doseTLDImaging phantom030218 nuclear medicine & medical imaging03 medical and health sciences0302 clinical medicineOpticsProtective Clothingfashionbackscatter correction factorCalibrationmedicineDosimetryFluoroscopylead apronWaste Management and DisposalDosimetermedicine.diagnostic_testRadiation Dosimetersbusiness.industryEquivalent dosePublic Health Environmental and Occupational HealthEquipment DesignGeneral MedicinefluoroscopyLeadFluoroscopy030220 oncology & carcinogenesisfashion.garmentCalibrationLead apronThermoluminescent DosimetryThermoluminescent dosimeterbusinessJournal of Radiological Protection
researchProduct

Variation of lattice constant and cluster formation in GaAsBi

2013

We investigate the structural properties of GaAsBi layers grown by molecular beam epitaxy on GaAs at substrate temperatures between 220–315 C. Irrespective of the growth temperature, the structures exhibited similar Bi compositions, and good overall crystal quality as deduced from X-Ray diffraction measurements. After thermal annealing at temperatures as low as 500 C, the GaAsBi layers grown at the lowest temperatures exhibited a significant reduction of the lattice constant. The lattice variation was significantly larger for Bi-containing samples than for Bi-free low-temperature GaAs samples grown as a reference. Rutherford backscattering spectrometry gave no evidence of Bi diffusing out o…

Materials scienceta114Annealing (metallurgy)Analytical chemistryGeneral Physics and Astronomyion beam analysisoptoelektroniikkaRutherford backscattering spectrometryCrystallographic defectCrystalLattice constantTransmission electron microscopyX-ray crystallographyMolecular beam epitaxyJournal of Applied Physics
researchProduct

Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition

2015

ZnO films were grown by atomic layer deposition at 35 °C on poly(methyl methacrylate) substrates using diethylzinc and water precursors. The film growth, morphology, and crystallinity were studied using Rutherford backscattering spectrometry, time-of-flight elastic recoil detection analysis, atomic force microscopy, scanning electron microscopy, and x-ray diffraction. The uniform film growth was reached after several hundreds of deposition cycles, preceded by the precursor penetration into the porous bulk and island-type growth. After the full surface coverage, the ZnO films were stoichiometric, and consisted of large grains (diameter 30 nm) with a film surface roughness up to 6 nm (RMS). T…

Materials scienceta114Scanning electron microscopeAnalytical chemistryNucleationthin film growthCrystal growthSurfaces and InterfacesCondensed Matter PhysicsRutherford backscattering spectrometrySurfaces Coatings and FilmsElastic recoil detectionCrystallinityAtomic layer depositionSurface roughnessta116zinc oxide filmsJournal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
researchProduct

Electrostatic backscattering by insulating obstacles

2012

AbstractWe introduce and analyze backscattering data for a three-dimensional obstacle problem in electrostatics. In particular, we investigate the asymptotic behavior of these data as (i) the measurement point goes to infinity and (ii) the obstacles shrink to individual points. We also provide numerical simulations of these data.

Measurement pointApplied Mathematicsmedia_common.quotation_subjectMathematical analysisInfinityElectrostaticsObstacle problemComputational MathematicsElectrostaticsObstacle problemCalculusBackscattering datamedia_commonMathematicsJournal of Computational and Applied Mathematics
researchProduct

Analysis of four years of ceilometer-derived aerosol backscatter profiles in a coastal site of the western Mediterranean

2018

Abstract We present the analysis of four years of measurements by a CL51 ceilometer in Burjassot (39.51 N, 0.42 W), a research station in the western Mediterranean coast. The 1-min resolution profiles of the CL51 are corrected, calibrated, grouped and cloud-screened to create a 1-h resolution database of aerosol backscatter profiles at 910 nm (βa) spanning from July 2013 to August 2017. A total of 21,247 βa profiles are obtained, covering 58% of the considered period. The analysis of the βa profiles as a function of the main aerosol in the atmosphere reveals that dust arrives at Burjassot mainly in the form of elevated layers, with a highest impact between 1 and 4 km. The βa profiles obtain…

Mediterranean climateAtmospheric Science010504 meteorology & atmospheric sciencesStratification (water)Wind directionAtmospheric sciences01 natural sciencesCeilometerAerosolAerosol backscatter010309 opticsBoundary layer0103 physical sciencesEnvironmental scienceLayering0105 earth and related environmental sciencesAtmospheric Research
researchProduct

A multi-instrument approach for characterizing the atmospheric aerosol optical thickness during the STAAARTE/DAISEX-99 campaign

2002

This work deals with the retrieval of the aerosol optical thickness (AOT) needed to carry out the atmospheric correction of remote sensing data measured in Barrax (Spain) on 4 June 1999 in the framework of 1999 Digital Airbone Imaging Spectrometer Experiment (DAISEX'99). The AOT was estimated through three approaches based on: spectral extinction of direct solar irradiance at ground level, airborne nephelometer measurements at different altitudes, and backscatter lidar in the lower troposphere. We found extremely low AOT values due to a cold Atlantic front that swept across the Iberian Peninsula from west to east producing light rain over the test area on 2 June 1999. The results were solar…

NephelometerBackscatterSingle-scattering albedoAtmospheric correctionImaging spectrometerGeofísicaSolar irradianceAtmospheric sciencesSpectrometerGeophysicsLidarExtinction (optical mineralogy)Aerosol optical thicknessGeneral Earth and Planetary SciencesEnvironmental scienceAtmospheric aerosolRemote sensing
researchProduct

Neutron powder diffraction study in the mixed molecular system (NaCN)1−x(KCN)x

1989

A detailed structural analysis of (NaCN${)}_{1\mathrm{\ensuremath{-}}\mathrm{x}}$(KCN${)}_{\mathrm{x}}$ mixed crystals with x=0.02, 0.19, and 0.95 was performed by neutron powder diffraction. The structural parameters of the cubic phases were refined, applying a model of preferred orientations. Different noncubic low-temperature phases were observed for x=0.02 and 0.95. For x=0.02 the antiferroelectric ordering of ${\mathrm{CN}}^{\mathrm{\ensuremath{-}}}$ dipoles at low temperatures is accompanied by significant alkali-alkali and alkali-${\mathrm{CN}}^{\mathrm{\ensuremath{-}}}$ sublattice shifts. Structural data are presented together with previous results for mixed crystals with x=0.59 and…

Neutron powder diffractionCrystallographyDipoleMaterials scienceNeutron diffractionAntiferroelectricityPowder diffractionElectron backscatter diffractionPhysical Review B
researchProduct

Ion beam analysis and alpha spectrometry of sources electrodeposited on several backings

1998

Abstract Alpha sources of several activities were prepared by electrodeposition of natural uranium onto four different backings: stainless steel, Ni, Mo and Ti. The influence of the activity, the type of backing, and the process of heating the source on the energy resolution of the spectra were investigated using alpha spectrometry and Rutherford Backscattering Spectrometry (RBS) techniques. Diffusion profiles of the radioactive deposits in the backings were obtained from RBS and related to the results using alpha spectrometry

Nuclear and High Energy PhysicsIon beam analysisMaterials scienceAlpha spectrometryResolution (mass spectrometry)Radiochemistrytechnology industry and agricultureAnalytical chemistryNatural uraniumRutherford backscattering spectrometryInstrumentation
researchProduct