Search results for "Contact area"

showing 3 items of 33 documents

Tribological properties of thin films made by atomic layer deposition sliding against silicon

2018

Interfacial phenomena, such as adhesion, friction, and wear, can dominate the performance and reliability of microelectromechanical (MEMS) devices. Here, thin films made by atomic layer deposition (ALD) were tested for their tribological properties. Tribological tests were carried out with silicon counterpart sliding against ALD thin films in order to simulate the contacts occurring in the MEMS devices. The counterpart was sliding in a linear reciprocating motion against the ALD films with the total sliding distances of 5 and 20 m. Al2O3 and TiO2 coatings with different deposition temperatures were investigated in addition to Al2O3-TiO2-nanolaminate, TiN, NbN, TiAlCN, a-C:H [diamondlike car…

kitkaMaterials scienceSiliconDiamond-like carbonfrictionnanomateriaalitchemistry.chemical_element02 engineering and technologyNitride01 natural sciencesAtomic layer deposition0103 physical sciencesComposite materialThin filmta216nanomaterials010302 applied physicsNanocompositeatomsta115ta114tribologiaSurfaces and InterfacesTribologyatomikerroskasvatus021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and Filmsatomitchemistrythin filmsatomic layer depositiontribologyohutkalvot0210 nano-technologyContact areaJOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A
researchProduct

Application of Tuning Fork Sensors for In-situ Studies of Dynamic Force Interactions Inside Scanning and Transmission Electron Microscopes

2012

Mechanical properties of nanoscale contacts have been probed in-situ by specially developed force sensor based on a quartz tuning fork resonator (TF). Additional control is provided by observation of process in scanning electron microscope (SEM) and transmission electron microscope (TEM). A piezoelectric manipulator allows precise positioning of atomic force microscope (AFM) probe in contact with another electrode and recording of the TF oscillation amplitude and phase while simultaneously visualizing the contact area in electron microscope. Electrostatic control of interaction between the electrodes is demonstrated during observation of the experiment in SEM. In the TEM system the TF senso…

lcsh:TN1-997Scanning Hall probe microscopeMaterials scienceScanning electron microscopebusiness.industryfrictiontuning forknanomechanicslaw.inventionNEMSOpticslawMicroscopymicroscopyGeneral Materials ScienceScanning tunneling microscopeElectron microscopeTuning forkbusinessContact areaNon-contact atomic force microscopylcsh:Mining engineering. MetallurgyMaterials Science
researchProduct

Kinematics of the patellofemoral joint. Investigations on a computer model with reference to patellar fractures.

1990

Patellofemoral kinematics were studied on a computer model. The articulating point of the patella moves from distal to proximal during flexion, until the quadriceps tendon starts to turn around the femur tendo-femoral gliding. The pattern of patellofemoral movement consists of a gliding and rolling component, the latter at its maximum at the beginning of flexion. The pathway of the instant centers of motion moves from dorsal to ventral during flexion. Stress analysis shows that the contact area is at all times the area of maximum bending stress. The distal part of the patella is the part with mechanical stress at all angles of flexion. The conclusions to be drawn for treatment are that frac…

musculoskeletal diseasesmedicine.medical_specialtyKnee Jointmedicine.medical_treatmentMovementKinematicsModels BiologicalFractures BonemedicineInternal fixationHumansOrthopedics and Sports MedicineFemurComputer Simulationbusiness.industryBiomechanicsGeneral MedicineAnatomyPatellamusculoskeletal systemBiomechanical Phenomenamedicine.anatomical_structureOrthopedic surgerySurgeryPatellaQuadriceps tendonContact areabusinessArchives of orthopaedic and trauma surgery
researchProduct