Search results for "Dislocation"

showing 10 items of 118 documents

Photoluminescence-Based Spatially Resolved Temperature Coefficient Maps of Silicon Wafers and Solar Cells

2020

In this article, we present a method to obtain implied open-circuit voltage images of silicon wafers and cells at different temperatures. The proposed method is then demonstrated by investigating the temperature coefficients of various regions across multicrystalline silicon wafers and cells from different heights of two bricks with different dislocation densities. Interestingly, both low and high temperature coefficients are found in dislocated regions on the wafers. A large spread of temperature coefficient is observed at regions with similar performance at 298 K. Reduced temperature sensitivity is found to be correlated with the increasing brick height and is exhibited by both wafers and…

010302 applied physicsBrickPhotoluminescenceMaterials sciencebusiness.industry02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesElectronic Optical and Magnetic MaterialsReduced properties0103 physical sciencesOptoelectronicsDegradation (geology)WaferElectrical and Electronic EngineeringDislocation0210 nano-technologybusinessTemperature coefficientImage resolutionIEEE Journal of Photovoltaics
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A Novel Method for Characterizing Temperature Sensitivity of Silicon Wafers and Cells

2019

In this paper, we present a novel method to obtain temperature dependent lifetime and implied-open-circuit voltage (iV OC ) images of silicon wafers and solar cells. First, the method is validated by comparing the obtained values with global values acquired from lifetime measurements (for wafers) and current-voltage measurements (for cells). The method is then extended to acquire spatially resolved images of iV OC temperature coefficients of silicon wafers and cells. Potential applications of the proposed method are demonstrated by investigating the temperature coefficients of various regions across multi-crystalline silicon wafers and cells from different heights of two bricks with differe…

010302 applied physicsBrickTemperature sensitivityMaterials sciencebusiness.industry02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesReduced propertiesImpurity0103 physical sciencesOptoelectronicsWaferSensitivity (control systems)Dislocation0210 nano-technologybusinessVoltage2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
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MeV-energy Xe ion-induced damage in LiF: The contribution of electronic and nuclear stopping mechanisms

2016

The contribution of electronic and nuclear damage mechanisms in the modification of structure and micromechanical properties of LiF crystals irradiated with 52, 224, and 450 MeV Xe ions at fluences 1010–1014 ions cm−2 has been studied. The ion-induced formation of dislocations and hardening in LiF at fluences above 1010 ions cm−2 has been observed. The depth profiles of nanoindentation show a joint contribution of electronic excitation and nuclear (impact) mechanisms to the ion-induced hardening. The electronic excitation mechanism dominates in the major part of the ion range while the impact mechanism prevails in a narrow zone at the end of the ion range. The efficiency of hardening produc…

010302 applied physicsMaterials science02 engineering and technologyNanoindentation021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesElectronic Optical and Magnetic MaterialsIon0103 physical sciencesHardening (metallurgy)SubstructureIrradiationDislocationAtomic physics0210 nano-technologyOrder of magnitudeExcitationphysica status solidi (b)
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Temperature Coefficients of Crystal Defects in Multicrystalline Silicon Wafers

2020

This article investigates the influence of crystallographic defects on the temperature sensitivity of multicrystalline silicon wafers. The thermal characteristics of the implied open-circuit voltage is assessed since it determines most of the total temperature sensitivity of the material. Spatially resolved temperature-dependent analysis is performed on wafers from various brick positions; intragrain regions, grain boundaries, and dislocation clusters are examined. The crystal regions are studied before and after subjecting the wafers to phosphorus gettering, aiming to alter the metallic impurity concentration in various regions across the wafers. Most intragrain regions and grain boundarie…

010302 applied physicsMaterials scienceCondensed matter physics02 engineering and technologyAtmospheric temperature range021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesCrystallographic defectElectronic Optical and Magnetic MaterialsCrystalGetterImpurity0103 physical sciencesWaferGrain boundaryElectrical and Electronic EngineeringDislocation0210 nano-technologyIEEE Journal of Photovoltaics
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EBSD, XRD and SRS characterization of a casting Al-7wt%Si alloy processed by equal channel angular extrusion: Dislocation density evaluation

2019

Abstract Aluminum‑silicon (Al Si) alloys of high silicon contents are composite materials; they are used whenever high casting properties are required. They are slightly ductile below 8wt%Si. An increase in ductility can be obtained by refining Si-crystals in elaboration or by a further hot working. In the present work, an Al-7wt%Si alloy was processed by Equal Channel Angular Extrusion (ECAE) at temperatures 20 °C and 160 °C up to three passes. The die was formed by two cylindrical channels with characteristic angles Φ = 110° and Ψ = 0. EBSD, X ray diffraction (XRD) and Strain Rate Sensitivity (SRS) were used to characterize the microstructure and the mechanical properties. High levels of …

010302 applied physicsMaterials scienceEqual channel angular extrusionMechanical Engineering02 engineering and technologyStrain rate021001 nanoscience & nanotechnologyCondensed Matter PhysicsMicrostructure01 natural sciencesCastingHot workingMechanics of Materials0103 physical sciencesGeneral Materials ScienceComposite materialDislocation0210 nano-technologyDuctilityElectron backscatter diffractionMaterials Characterization
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Interaction of carbon with microstructural defects in a W-Re matrix: An ab initio assessment

2019

The interaction of carbon atoms with point defects and the core of edge and screw dislocations with Burgers vector a 0 / 2 ⟨ 111 ⟩ in W and a W-Re matrix is studied by means of ab initio calculations. The structure and energetics of the ground-state atomic configurations are presented and rationalized. It is found that di-vacancies, which are thermally unstable in pure W according to the state-of-the-art ab initio calculations, can nucleate at C and Re-C complexes, which fill the gap in the explanation of the emergence of nanovoids observed experimentally under irradiation. Also, on the basis of the recent experimental evidence and our calculations, the temperature ranges for the manifestat…

010302 applied physicsMaterials scienceNucleationAb initiochemistry.chemical_elementGeneral Physics and Astronomy02 engineering and technologyTungsten021001 nanoscience & nanotechnology01 natural sciencesCrystallographic defectMolecular physicsCondensed Matter::Materials SciencechemistryImpurityAb initio quantum chemistry methods0103 physical sciencesDislocation0210 nano-technologyBurgers vector
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How Gettering Affects the Temperature Sensitivity of the Implied Open Circuit Voltage of Multicrystalline Silicon Wafers

2019

The temperature sensitivity of the open circuit voltage of a solar cell is mainly driven by changes in the intrinsic carrier concentration, but also by the temperature dependence of the limiting recombination mechanisms in the cell. This paper investigates the influence of recombination through metallic impurities on the temperature sensitivity of multicrystalline silicon wafers. Spatially resolved temperature dependent analysis is performed to evaluate the temperature sensitivity of wafers from different brick positions before and after being subjected to phosphorus diffusion gettering. Local spatial analysis is performed on intra-grain areas, dislocation clusters and grain boundaries. Lar…

010302 applied physicsMaterials scienceOpen-circuit voltagebusiness.industry02 engineering and technology021001 nanoscience & nanotechnology01 natural scienceslaw.inventionGetterlaw0103 physical sciencesSolar cellOptoelectronicsGrain boundaryWaferSensitivity (control systems)Dislocation0210 nano-technologybusinessRecombination2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
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Depth profiles of damage creation and hardening in MgO irradiated with GeV heavy ions

2019

This work has been performed within the framework of the EUROfusion Enabling Research project: ENR-MFE19.ISSP-UL-02 “Advanced experimental and theoretical analysis of defect evolution and structural disordering in optical and dielectric materials for fusion applications”. The views and opinions expressed herein do not necessarily reflect those of the European Commission.

010302 applied physicsNuclear and High Energy PhysicsPhotoluminescenceMaterials scienceDislocations02 engineering and technologyNanoindentation021001 nanoscience & nanotechnologySwift heavy ions01 natural sciencesMgO crystalsNanoindentationIonCondensed Matter::Materials ScienceIndentation0103 physical sciencesHardening (metallurgy):NATURAL SCIENCES:Physics [Research Subject Categories]IrradiationComposite materialDislocation0210 nano-technologySpectroscopyInstrumentationPhotoluminescenceNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Chondrodysplasia with multiple dislocations: comprehensive study of a series of 30 cases

2017

The group of chondrodysplasia with multiple dislocations includes several entities, characterized by short stature, dislocation of large joints, hand and/or vertebral anomalies. Other features, such as epiphyseal or metaphyseal changes, cleft palate, intellectual disability are also often part of the phenotype. In addition, several conditions with overlapping features are related to this group and broaden the spectrum. The majority of these disorders have been linked to pathogenic variants in genes encoding proteins implicated in the synthesis or sulfation of proteoglycans (PG). In a series of 30 patients with multiple dislocations, we have performed exome sequencing and subsequent targeted…

0301 basic medicineSpondyloepimetaphyseal dysplasiabusiness.industry030105 genetics & hereditymedicine.diseaseBioinformaticsPhenotypeShort stature3. Good health03 medical and health sciencesCatel–Manzke syndromeGeneticsEtiologyMedicineLarsen syndromeJoint dislocationmedicine.symptom10. No inequalitybusinessGenetics (clinical)Exome sequencingClinical Genetics
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Retrospective review of L3 myelomeningocele in three age groups: should posterolateral iliopsoas transfer still be indicated to stabilize the hip?

2005

The data from 58 hips in 29 myelodysplastic children with L3 paralysis has been reviewed retrospectively. Posterolateral transfer of the iliopsoas (Sharrard technique) was performed on all hips to correct muscle imbalance between 1975 and 1992. The average length of follow-up was 21 years. Preoperatively, 58.6% of the hips were either subluxated or dislocated (these were surgically reduced at the same stage). Radiological assessment revealed that 91.4% of the hips were stable at preschool age and 84.5% in adolescence. Of the patients 86% were functional walkers at preschool age and 75.8% in adolescence. Downward transitions in seven patients were related to the presence of scoliosis, spasti…

AdultJoint InstabilityMalemusculoskeletal diseasesmedicine.medical_specialtyMeningomyeloceleAdolescentWalkingScoliosisImmobilizationJoint capsuleParalysismedicineHip DislocationHumansParalysisOrthopedics and Sports MedicineSpasticityStage (cooking)ChildMuscle SkeletalRetrospective Studiesbusiness.industryRetrospective cohort studymedicine.diseaseSurgeryTreatment Outcomemedicine.anatomical_structureChild PreschoolRadiological weaponPediatrics Perinatology and Child HealthFemaleHip Jointmedicine.symptomIliopsoasbusinessJoint CapsuleFollow-Up StudiesJournal of Pediatric Orthopaedics B
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