Search results for "Electron diffraction"
showing 10 items of 191 documents
Application of clustering techniques to electron-diffraction data: determination of unit-cell parameters.
2012
A new approach to determining the unit-cell vectors from single-crystal diffraction data based on clustering analysis is proposed. The method uses the density-based clustering algorithm DBSCAN. Unit-cell determination through the clustering procedure is particularly useful for limited tilt sequences and noisy data, and therefore is optimal for single-crystal electron-diffraction automated diffraction tomography (ADT) data. The unit-cell determination of various materials from ADT data as well as single-crystal X-ray data is demonstrated.
Automated diffraction tomography combined with electron precession: a new tool forab initionanostructure analysis
2009
AbstractThree-dimensional electron diffraction data was collected with our recently developed module for automated diffraction tomography and used to solve inorganic as well as organic crystal structuresab initio. The diffraction data, which covers nearly the full relevant reciprocal space, was collected in the standard nano electron diffraction mode as well as in combination with the precession technique and was subsequently processed with a newly developed automated diffraction analysis and processing software package. Non-precessed data turned out to be sufficient forab initiostructure solution by direct methods for simple crystal structures only, while precessed data allowed structure s…
Structure solution with automated electron diffraction tomography data: different instrumental approaches
2011
Summary Over the past few years automated electron diffraction tomography has become an established technique for structure solution of nano-crystalline material. The intentional choice of an arbitrary tilt axis and thus, the use of nonoriented diffraction patterns (off-zone acquisition) together with fine equidistant sampling of the reciprocal space result in high quality intensity data sets. Coupling automated electron diffraction tomography with electron beam precession (Vincent & Midgley, 1994) enables sampling of intensities between the static slices of reciprocal space and therefore enhances the quality of intensity data further; relatively complex structures have been solved using 3D…
The Instability of the NbTe2 Surface Structure
2002
Low energy electron diffraction from clean NbTe 2 surfaces shows very diffuse reflections. The effect is attributed to an anisotropic heating of the irradiated Te-Nb-Te surface layer. Diffraction patterns for electron energies below 90 eV correspond to an overlapped contribution from numerous domains, belonging to three orientational variants. Electrons of higher energies stabilize the parent high-temperature CdI 2 structure. A similar effect is observed during scanning tunneling microscopy, where the expected surface corrugation is usually lost for tunneling currents of a few ten nA.
A multi-technique, micrometer- to atomic-scale description of a synthetic analogue of chukanovite, Fe-2(CO3)(OH)(2)
2014
International audience; A synthetic analogue of chukanovite Fe-2(CO3)(OH)(2) is formed during experimental work on iron-clay interactions simulating the cooling of containers in radioactive waste repositories. Despite its small size and the mixture with other minerals it is undoubtedly identified by X-Ray Diffraction, Fourier Transform Infrared Spectroscopy, Scanning Electron Microscopy and Transmission Electron Microscopy. For the first time, the structural characterisation of a synthetic chukanovite is carried out thanks to the combination of Automated Diffraction Tomography and Precession Electron Diffraction. Refinement results and comparison with literature data show that the structure…
3D Electron Diffraction: The Nanocrystallography Revolution
2019
Crystallography of nanocrystalline materials has witnessed a true revolution in the past 10 years, thanks to the introduction of protocols for 3D acquisition and analysis of electron diffraction data. This method provides single-crystal data of structure solution and refinement quality, allowing the atomic structure determination of those materials that remained hitherto unknown because of their limited crystallinity. Several experimental protocols exist, which share the common idea of sampling a sequence of diffraction patterns while the crystal is tilted around a noncrystallographic axis, namely, the goniometer axis of the transmission electron microscope sample stage. This Outlook review…
Crystal structure of disordered nanocrystalline $\alpha^{II}$-quinacridone determined by electron diffraction
2016
CrystEngComm 18(4), 529 - 535(2016). doi:10.1039/C5CE01855B
Uniaxial Alignment of Polycyclic Aromatic Hydrocarbons by Solution Processing
2005
The self-organization of two polycyclic aromatic hydrocarbons with different aromatic core sizes, dodecylphenyl-substituted hexa-peri- hexabenzocoronene and an extended disk consisting of 96 carbon atoms 6-fold-alkyl-substituted, on the surface from solution has been investigated. Highly ordered surface layers of both materials could be obtained by the zone-casting technique, despite an apparently low self-organization in drop-cast films. The zone-cast films revealed high macroscopic uniaxial orientation of the columns with a molecular edge-on arrangement on the glass support as confirmed by polarized optical microscopy, UV-vis measurements in polarized light, high-resolution transmission e…
Defects at the TiO2(100) surface probed by resonant photoelectron diffraction.
2006
We report photoelectron diffraction (PED) experiments of weakly sub-stoichiometric TiO 2 (100) rutile surfaces. Apart from standard core-level PED from the Ti-2p3/2 line, we have studied valence band PED from the defect induced Ti-3d states in the insulating band gap. For maximum yield, the latter were resonantly excited at the Ti-2p absorption edge. The PED patterns have been analyzed within the forward scattering approximation as well as by comparison with simulated PED patterns obtained in multiple scattering calculations. The analysis shows that the defect induced Ti-3d charge is mainly located on the second layer Ti atoms. © 2007 Elsevier B.V. All rights reserved.
Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.
1987
This paper reports investigations of ZnS quasi-amorphous films by electroreflectance (ER). The films were produced by thermal evaporation and their structure determined by electron diffraction. A voltage Vo cos cut was applied through the film with two evaporated Al electrodes. A lock-in amplifier gave 2 signals, Sf at f=ω/2π frequency and S2f at 2f frequency. The S2f spectrum, characteristic of the centrosymmetric bulk component of the film, reveals tails of localized states typical of amorphous semi-conductors. The Sf spectrum, characteristic of the interface layers with broken centro-symmetry, reveals tails of impurity levels which we attributed to diffusion of the electrode metal into t…