Search results for "FFR"
showing 10 items of 1798 documents
Resonant Photoelectron Diffraction
2013
A layout of a resonant photoelectron diffraction, RESPED, experiment is described from the theoretical basis to the data acquisition and analysis procedures. The theory of the resonance between the directly emitted photoelectron of a selected valence band and the electron emitted by autoionization (Auger) of the same valence band is presented within a formal frame. The critical issue of the angular symmetry and distribution of the resonating electron is discussed in connection with the current computational protocols for photoelectron diffraction, PED, analysis. A few representative applications are presented, where RESPED is shown to overcome some limitations of conventional PED thanks to …
Recent Advances in 3D Structured Illumination Microscopy
2018
In structured illumination microscopy (SIM) the sample under investigation is illuminated using a structured illumination (SI) pattern. This SI pattern encodes high spatial frequencies of fine features within the sample, which usually are not transferred by the conventional three-dimensional (3D) optical transfer function (OTF) of the imaging system and fills the missing cone of frequencies in the OTF for better discrimination of the out-of-focus light. Thereby, SIM provides super-resolution (SR) performance beyond the diffraction limit and optical-sectioning (OS) capability with the use of data post-processing approaches. 3D structured patterns that include lateral and axial variations in …
Effect of Penetrating Irradiation on Polarization Reversal in PZT Thin Films
2006
Spatially non-uniform imprint behavior induced by X-ray synchrotron, electron, and neutron irradiation has been investigated in Pb(Zr,Ti)O3 thin films. The obtained effects have been explained as a result of acceleration of the bulk screening process induced by irradiation. It has been shown that the spatial distribution of the internal bias field is determined by the domain pattern existing during irradiation. The microstructural changes in the structural characteristics during fatigue cycling have been revealed by high resolution synchrotron X-ray diffraction experiments. Their correlation with the evolution of the switching characteristics has been revealed and discussed.
Towards automated diffraction tomography. Part II--Cell parameter determination.
2008
Automated diffraction tomography (ADT) allows the collection of three-dimensional (3d) diffraction data sets from crystals down to a size of only few nanometres. Imaging is done in STEM mode, and diffraction data are collected with quasi-parallel beam nanoelectron diffraction (NED). Here, we present a set of developed processing steps necessary for automatic unit-cell parameter determination from the collected 3d diffraction data. Cell parameter determination is done via extraction of peak positions from a recorded data set (called the data reduction path) followed by subsequent cluster analysis of difference vectors. The procedure of lattice parameter determination is presented in detail f…
Characterization of opal photonic hetero-crystals by light scattering
2006
Spectra of the light scattered in the heterogeneous photonic crystal based on the thin triple-film opal, which was prepared by successive, convective force-assisted crystallisation of colloidal suspensions containing spheres of 374, 474 and again 374 nm in diameter, have been studied in the wavelength range of low order photonic bandgaps. If the ballistic regime of light propagation is preserved, the forward scattered light becomes the subject of the diffraction attenuation, whereas the backscattered light experiences both the diffraction enhancement and attenuation. A variety of possible configurations of scattered light measurements have been examined and corresponding spectra of scattere…
Light Propagation in Heterogeneous Opal-Based Photonic Crystals
2006
Ballistic light propagation in the heterogeneous photonic crystals based on the thin triple-film opal have been studied in the wavelength range of low order photonic bandgaps. Since the scattered light experiences the diffraction attenuation, the spectra and the angle diagrams of the transmitted and forward scattered light have been used to identify the effect of heterostructuring.
<title>Mechanisms of holographic recording in amorphous semiconductor films</title>
1998
The mechanisms of holographic recording in (mainly chalcogenide) amorphous semiconductor films are reviewed including photoinduced structural changes, relaxational structural changes, recharging of localized states in the band gap, and photoinduced anisotropy. The holographic properties in these cases are compared. Different effects of hologram self-enhancement are also considered.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
<title>Holographic recording in amorphous chalcogenide semiconductor photoresists</title>
1998
The properties and mechanism of relaxation processes of holographic gratings in amorphous chalcogenide semiconductor films have been studied. The possibilities of the practical applications of these materials as the photoresists for the production of the relief holograms and holographic optical elements are discussed. It is shown that the self- enhancement phenomenon of holographic recording in amorphous chalcogenide semiconductor films by light or thermal treatment can be used to increase the diffraction efficiency of the holograms.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
<title>Investigation of As<formula><inf><roman>2</roman></inf></formula>S<formula><inf><roma…
2008
We have performed the investigation of dot matrix holographic recording in amorphous As2S3 chalcogenide films with different thickness on Al coated glass substrates. The control over the interference minimum of reflection during the evaporation process allowed obtaining As2S3-Al system with a minimum value of initial reflection in defined spectral region. The investigation of dependence of diffraction efficiency of holographic recording on both film thickness and initial conditions of reflectivity in the system was performed. The main advantage of this type of system is the possibility to increase optical sensitivity of material in predefined spectrum region for phase hologram recording.© (…
<title>Angular selectivity of thin gratings</title>
2005
The angular selectivity of thin gratings is studied both experimentally and theoretically. The concepts of thick and thin gratings are analyzed. Thin holographic gratings recorded in a-As-S-Se films have exhibited pronounced and oscillatory diffraction efficiency angular dependences. These results are explained by the obliquity factor in Fresnel-Kirchhof diffraction integral and by finite beam and grating sizes. It is also shown that oscillatory diffraction efficiency angular dependences, most probably, arise due to the interference of diffracted waves of different orders because dephasing can be significant for small grating strengths and large enough readout angles. Fabry-Perot resonator …