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showing 10 items of 59416 documents

Partial discharge of gel insulated high voltage power modules subjected to unconventional voltage waveforms

2016

Performances and duration of the new generation of high voltage power electronic components are dependent on dielectric materials aim to insulating their internal terminals. The presence of defects, some due to faults generated during the manufacturing process, but also due to the internal design of layers and connections, can cause local enhancements of electric field and consequently possible activity of partial discharges phenomena or other effects (aging, tracking) that may result in reduction of device reliability. Furthermore, the usage of unconventional voltage waveforms, like square waves or pulse width modulated waves, additionally increases the electrical aging of the insulation s…

010302 applied physicsMaterials sciencebusiness.industryAcoustics020208 electrical & electronic engineeringElectrical engineeringHigh voltage02 engineering and technologyInsulated-gate bipolar transistor01 natural sciencesSettore ING-IND/31 - ElettrotecnicaReliability (semiconductor)Partial Discharge Gel insulation IGBTvisual_artInsulation systemPower module0103 physical sciencesElectronic componentPartial discharge0202 electrical engineering electronic engineering information engineeringvisual_art.visual_art_mediumbusinessVoltage2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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Deformation of bubbles in silicon gel insulation under an alternating electric field

2019

The behavior of silicone gel under electrical stress plays a significant role in the reliability and durability of high voltage electronic power devices due to its widespread use for the insulation of IGBT modules and other components. The charges accumulation at the bubble boundaries leads to significant displacements due to the establishment of Coulombic forces and the high deformability of colloidal system. The main purpose of this work is to validate a numerical approach useful to investigate, for a given silicone gel, the non-linear relation between the applied HVDC stress and the electric field over an air bubble within the insulation bulk. The analysis has been carried out by means o…

010302 applied physicsMaterials scienceinsulationreliabilityDeformation (mechanics)020209 energyBubbleHigh voltage02 engineering and technologyDielectric01 natural sciencesSpace chargeIGBTSilicone gelStress (mechanics)chemistry.chemical_compoundpartial dischargeSettore ING-IND/31 - ElettrotecnicaSiliconechemistryElectric field0103 physical sciences0202 electrical engineering electronic engineering information engineeringComposite material
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Kinetic instabilities in pulsed operation mode of a 14 GHz electron cyclotron resonance ion source

2016

The occurrence of kinetic plasma instabilities is studied in pulsed operation mode of a 14 GHz Aelectron cyclotron resonance type electron cyclotron resonance ion source. It is shown that the temporal delay between the plasma breakdown and the appearance of the instabilities is on the order of 10- 100 ms. The most important parameters affecting the delay are magnetic field strength and neutral gas pressure. It is demonstrated that kinetic instabilities limit the high charge state ion beam production in the unstable operating regime. peerReviewed

010302 applied physicsMaterials scienceta114Ion beamCyclotron resonancePlasma01 natural sciencesplasma electronsIon sourceElectron cyclotron resonanceFourier transform ion cyclotron resonance010305 fluids & plasmasMagnetic fieldpulsed operation modePhysics::Plasma Physics0103 physical scienceselectron cyclotron resonance ion sourceskinetic instabilitiesAtomic physicsInstrumentationIon cyclotron resonanceReview of Scientific Instruments
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State-space formulation of scalar Preisach hysteresis model for rapid computation in time domain

2015

A state-space formulation of classical scalar Preisach model (CSPM) of hysteresis is proposed. The introduced state dynamics and memory interface allow to use the state equation, which is rapid in calculation, instead of the original Preisach equation. The main benefit of the proposed modeling approach is the reduced computational effort which requires only a single integration over the instantaneous line segment in the Preisach plane. Numerical evaluations of the computation time and model accuracy are provided in comparison to the CSPM which is taken as a reference model.

010302 applied physicsMemory interfacePreisach model of hysteresis0209 industrial biotechnologyApplied MathematicsComputationScalar (mathematics)02 engineering and technologySystems and Control (eess.SY)01 natural sciences020901 industrial engineering & automationLine segmentControl theoryModeling and Simulation0103 physical sciencesFOS: Electrical engineering electronic engineering information engineeringApplied mathematicsComputer Science - Systems and ControlTime domainReference modelMathematics
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Integral imaging with Fourier-plane recording

2017

Integral Imaging is well known for its capability of recording both the spatial and the angular information of threedimensional (3D) scenes. Based on such an idea, the plenoptic concept has been developed in the past two decades, and therefore a new camera has been designed with the capacity of capturing the spatial-angular information with a single sensor and after a single shot. However, the classical plenoptic design presents two drawbacks, one is the oblique recording made by external microlenses. Other is loss of information due to diffraction effects. In this contribution report a change in the paradigm and propose the combination of telecentric architecture and Fourier-plane recordin…

010302 applied physicsMicrolensDiffractionIntegral imagingPlane (geometry)Computer sciencebusiness.industryComputationComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONOblique case01 natural sciencesÒptica Aparells i instruments010309 opticssymbols.namesakeFourier transformOptics0103 physical sciencessymbolsComputer visionDepth of fieldArtificial intelligenceFourier Anàlisi debusinessThree-Dimensional Imaging, Visualization, and Display 2017
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Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry

2000

A method for determining correct depth profiles from samples with rough surfaces is presented. The method combines Rutherford backscattering spectrometry with atomic force microscopy. The topographical information obtained by atomic force microscopy is used to calculate the effect of the surface roughness on the backscattering spectrum. As an example, annealed Au/ZnSe heterostructures are studied. Gold grains were observed on the surfaces of the annealed samples. The annealing also caused diffusion of gold into the ZnSe. Backscattering spectra of the samples were measured with a 2 MeV 4He+ ion beam. A scanning nuclear microprobe was used to verify the results by measuring backscattering fro…

010302 applied physicsMicroprobeMaterials scienceIon beamAnnealing (metallurgy)Analytical chemistryGeneral Physics and AstronomyHeterojunction02 engineering and technologyCondensed Matter::Mesoscopic Systems and Quantum Hall Effect021001 nanoscience & nanotechnologyRutherford backscattering spectrometry01 natural sciencesSpectral lineCondensed Matter::Materials Science0103 physical sciencesSurface roughness0210 nano-technologySpectroscopyJournal of Applied Physics
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Atomic, electronic and magnetic structure of an oxygen interstitial in neutron-irradiated Al2O3 single crystals

2020

This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014-2018 and 2019-2020 under Grant Agreement No. 633053 and Enabling Research project: ENR-MFE19.ISSP-UL-02 “Advanced experimental and theoretical analysis of defect evolution and structural disordering in optical and dielectric materials for fusion application”. The views and opinions expressed herein do not necessarily reflect those of the European Commission. In addition, the research leading to these results has received funding from the Estonian Research Council grant (PUT PRG619).

010302 applied physicsMultidisciplinaryMaterials scienceMagnetic momentMagnetic structurelcsh:Rlcsh:MedicineFormal charge02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesMolecular physicslaw.inventionIonBond lengthlaw0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]Density functional theorylcsh:Q0210 nano-technologyElectron paramagnetic resonanceGround statelcsh:ScienceScientific Reports
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Study of the multipactor phenomenon using a full-wave integral equation technique

2017

Abstract Multipactor effect is a well-known phenomenon of RF breakdown in satellite payloads which degrades components, generates undesirable harmonics, contributes to power dissipation and increases noise in communications. Traditionally, multipactor has been investigated with the aim of obtaining the so-called multipactor threshold voltage, or to present different multipaction detection methods. However, very little attention has been focused on analysing this phenomenon using a multimodal approach. The main goal of this work is to analyse the interaction between a multipactor current and a realistic microwave cavity by means of a rigorous and accurate formulation. For the first time to t…

010302 applied physicsMultipactor effect020206 networking & telecommunications02 engineering and technologyDissipation01 natural sciencesNoise (electronics)Integral equationAdmittance parametersHarmonics0103 physical sciences0202 electrical engineering electronic engineering information engineeringElectronic engineeringElectrical and Electronic EngineeringRepresentation (mathematics)Microwave cavityMathematicsAEU - International Journal of Electronics and Communications
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Analysis of thin high-k and silicide films by means of heavy ion time-of-flight forward-scattering spectrometry

2006

The use of forward scattered heavy incident ions in combination with a time-of-flight-energy telescope provides a powerful tool for the analysis of very thin (5–30 nm) films. This is because of greater stopping powers and better detector energy resolution for heavier ions than in conventional He-RBS. Because of the forward scattering angle, the sensitivity is greatly enhanced, thus reducing the ion beam induced desorption during the analysis of very thin films. The drawback of forward scattering angle is the limited mass separation for target elements. We demonstrate the performance of the technique with the analysis of 25 nm thick NiSi films and atomic layer deposited 6 nm thick HfxSiyOz f…

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceIon beamSiliconbusiness.industryScatteringForward scatterchemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnology01 natural sciences7. Clean energyIonElastic recoil detectionTime of flightchemistry0103 physical sciencesOptoelectronicsAtomic physicsThin film0210 nano-technologybusinessInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Lattice sites of diffused gold and platinum in epitaxial ZnSe layers

2000

Abstract The lattice location of diffused gold and platinum in zinc selenide (ZnSe) epitaxial layers was studied using the Rutherford backscattering (RBS) channeling technique. Thin Au and Pt films were evaporated onto ZnSe samples. The Au/ZnSe samples were annealed at 525°C and the residual Au film was removed by etching. Channeling angular scan measurements showed that about 30% of Au atoms were close to substitutional site (displaced about 0.2 A). In the case of the Pt/ZnSe samples the annealing temperatures ranged from 600°C to 800°C. The Pt minimum yields along 〈1 0 0〉 direction were close to the random value, varying from 80% to 90%. The measured Pt angular scans along 〈1 0 0〉 and 〈1 …

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceScatteringAnnealing (metallurgy)chemistry.chemical_element02 engineering and technologyAtmospheric temperature range021001 nanoscience & nanotechnologyEpitaxy01 natural sciencessymbols.namesakechemistry.chemical_compoundCrystallographyTransition metalchemistry0103 physical sciencessymbolsZinc selenideRutherford scattering0210 nano-technologyPlatinumInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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