Search results for "Hard"

showing 10 items of 2294 documents

Effect of resin thickness, and curing time on the micro-hardness of bulk-fill resin composites

2015

Background: Bulk-fill resin composite has been introduced, their manufacturers claimed that they can be applied in bulks of 4mm, without necessitating a prolonged curing time, or a light curing unit with increased irradiance. Thus this study was conducted to evaluate the effect of resin thickness, and curing time on the micro-hardness of two bulk -fill resin composites; Tetric Evo-Ceram [TE], and X-trafil [XF]. Material and Methods: 120 cylindrical specimens were prepared, and divided into 24 groups (n=5/group), representing the two bulk-fill resin composites, three different material thicknesses (2, 3 and 4 mm) and the four curing times used in the study (10, 20, 40, and 60 seconds). The s…

Materials scienceResearchResin compositeOdontologíaBulk fill:CIENCIAS MÉDICAS [UNESCO]BioinformaticsCiencias de la saludIndentation hardnessOperative Dentistry and EndodonticsLight curingCuring timeDwell timeUNESCO::CIENCIAS MÉDICASComposite materialGeneral DentistryCuring (chemistry)Journal of Clinical and Experimental Dentistry
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Crystallizing polystyrene microgel colloids

2007

Spherical microgel particles of sufficiently high degree of internal cross-linking and swollen in a good solvent in many respects behave quite similarly to hard-sphere colloids. Due to solvent uptake they can be refractive-index-matched and density-matched in suitable organic solvents. We present preliminary measurements of the crystallization kinetics of 1:10 cross-linked polystyrene microgel particles. We measured Bragg and small-angle light scattering of the solidifying shear melt. Two different scattering patterns, a set of Debye-Scherrer rings and a second ring pattern at small angles could be observed. We check for similarities and differences compared to previously investigated collo…

Materials scienceScatteringKineticsHard spheresLight scatteringCondensed Matter::Soft Condensed MatterSolventShear (sheet metal)chemistry.chemical_compoundColloidchemistryChemical engineeringPolymer chemistryPolystyrenePhysics::Chemical Physics
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PPG embedded system for blood pressure monitoring

2014

In this work, we have designed and implemented a microcontroller-based embedded system for blood pressure monitoring through a PhotoPlethysmoGraphic (PPG) technique. In our system, it is possible to perform PPG measurements via reflectance mode. Hardware novelty of our system consists in the adoption of Silicon PhotoMultiplier detectors. The signal received from the photodetector is used to calculate the instantaneous heart rate and therefore the heart rate variability. The obtained results show that, by using our system, it is possible to easily extract both the PPG and the breath signal. These signals can be used to monitor the patients during the convalescence both in hospital and at hom…

Materials scienceSettore INF/01 - InformaticaPhotoPlethysmoGraphybusiness.industryDetectorPhotodetectorSettore ING-INF/02 - Campi ElettromagneticiSignalReflectivitySilicon PhotoMultiplierembedded systemMicrocontrollerSilicon photomultipliersensorEmbedded systemHeart rate variabilityBlood pressure monitoringsense organsbusinessComputer hardware2014 AEIT Annual Conference - From Research to Industry: The Need for a More Effective Technology Transfer (AEIT)
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Experimental investigation of Brillouin and Raman scattering in a 2SG sulfide glass microstructured chalcogenide fiber.

2008

International audience; In this work, we investigate the Brillouin and Raman scattering properties of a Ge15Sb20S65 chalcogenide glass microstructured single mode fiber around 1.55 microm. Through a fair comparison between a 2-m long chalcogenide fiber and a 7.9-km long classical single mode silica fiber, we have found a Brillouin and Raman gain coefficients 100 and 180 larger than fused silica, respectively.

Materials scienceSilica fiberLightChalcogenideChalcogenide glass02 engineering and technologySulfidesSpectrum Analysis Raman01 natural sciences010309 opticschemistry.chemical_compound020210 optoelectronics & photonicsOpticsDouble-clad fiberBrillouin scattering0103 physical sciences0202 electrical engineering electronic engineering information engineeringFiber Optic TechnologyScattering RadiationComputer Simulationbusiness.industryMicrostructured optical fiberEquipment Design[CHIM.MATE]Chemical Sciences/Material chemistryModels TheoreticalAtomic and Molecular Physics and OpticsEquipment Failure AnalysischemistryNonlinear Dynamics[ CHIM.MATE ] Chemical Sciences/Material chemistryChalcogensGlassbusinessHard-clad silica optical fiberPhotonic-crystal fiber
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Tb/s switching fabrics for optical interconnects using heterointegration of plasmonics and silicon photonics: The FP7 PLATON approach

2010

We present recent work that is carried out within the FP7 project PLATON on novel Tb/s switch fabric architectures and technologies for optical interconnect applications, employing heterointegration of plasmonics, silicon photonics and electronics.

Materials scienceSilicon photonicsSiliconbusiness.industryOptical interconnectchemistry.chemical_elementOptical switchMultiplexingchemistryHardware_INTEGRATEDCIRCUITSOptoelectronicsIntegrated opticsElectronicsbusinessPlasmon2010 IEEE Photinic Society's 23rd Annual Meeting
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-ray-induced intrinsic defect processes in fluorine-doped synthetic SiO2 glasses of different fluorine concentrations

2009

Fluorine-doped synthetic SiO2 glass is suitable for investigating intrinsic defect processes in SiO2 glass because of the high radiation hardness and the low concentrations of defect precursors such as the strained Si O Si bonds and impurity-related network modifiers including SiOH, SiH, and SiCl groups. When the concentrations of the defect precursors are minimized by moderate fluorine doping into SiO2 glass, formation of oxygen vacancy–interstitial pairs (Frenkel pairs) is the primarily Co60γ-ray-induced defect process. However, heavy fluorine doping tends to degrade the radiation hardness and enhance the formation of the silicon and oxygen dangling bonds, suggesting the presence of anoth…

Materials scienceSiliconMechanical EngineeringDopingtechnology industry and agricultureDangling bondHigh radiationchemistry.chemical_elementCondensed Matter PhysicsPhotochemistryOxygenchemistryMechanics of MaterialsFluorineGeneral Materials ScienceFluorine dopingRadiation hardeningMaterials Science and Engineering: B
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Peculiar aspects of nanocrystal memory cells: Data and extrapolations

2003

Nanocrystal memory cell are a promising candidate for the scaling of nonvolatile memories in which the conventional floating gate is replaced by an array of nanocrystals. The aim of this paper is to present the results of a thorough investigation of the possibilities and the limitations of such new memory cell. In particular, we focus on devices characterized by a very thin tunnel oxide layer and by silicon nanocrystals formed by chemical vapor deposition. The direct tunneling of the electrons through the tunnel oxide, their storage into the silicon nanocrystals, and furthermore, retention, endurance, and drain turn-on effects, well-known issues for nonvolatile memories, are all investigate…

Materials scienceSiliconQuantum dotchemistry.chemical_elementNanotechnologyChemical vapor depositionSettore ING-INF/01 - ElettronicaComputer Science ApplicationsNon-volatile memorySemiconductor memorieTunnel effectEngineering (all)chemistryNanocrystalMemory cellHardware and ArchitectureNanotechnologyElectrical and Electronic EngineeringThin filmHot-carrier injection
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Effect of germanium addition on the properties of reactively sputtered ZrN films

2005

For the first time, Zr-Ge-N films were deposited on silicon and steel substrates by sputtering a Zr-Ge composite target in reactive Ar-N2 mixture. The films were characterised by electron probe microanalysis, X-ray diffraction, micro-Raman spectroscopy and depth-sensing indentation. The effects of the Ge content and substrate bias voltage on the films' structure, internal stress, hardness and oxidation resistance were investigated. Substrate bias strongly influenced the chemical composition of the films being observed by means of a steep decrease in the Ge content for negative bias voltages higher than -80 V. In these cases, a significant hardness improvement was registered. For -100 V bias…

Materials scienceSiliconReactive sputteringMetals and Alloyschemistry.chemical_elementMineralogyGermaniumSurfaces and InterfacesSubstrate (electronics)Surfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsAmorphous solidTetragonal crystal systemchemistryHardnessSputteringOxidationCavity magnetronMaterials ChemistryCubic zirconiaComposite materialThin Solid Films
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Power losses comparison between Silicon Carbide and Silicon devices for an isolated DC-DC converter

2021

In recent years, new efficient power devices have been implemented. Silicon Carbide has replaced silicon as regards the production and the utilization of many devices, such as MOSFETs, diodes, IGBTs and many others. SiC devices are characterized by a low reverse recovery charge, high carrier saturation velocity, by which it is possible to work at high frequency, and high breakdown voltage. Thanks to the great thermal conductivity and the wide bandgap, these devices can operate at high temperature and reach high voltages and currents. What is important to stress is the fact that power losses in SiC devices are lower than the silicon ones. These are the reasons why these devices are utilized …

Materials scienceSiliconSiC devicesbusiness.industryDC-DC converterschemistry.chemical_elementSaturation velocityHardware_PERFORMANCEANDRELIABILITYSettore ING-IND/32 - Convertitori Macchine E Azionamenti ElettriciSettore ING-INF/01 - ElettronicaIsolated power converterschemistry.chemical_compoundchemistryPower electronicsMOSFETHardware_INTEGRATEDCIRCUITSSilicon carbideOptoelectronicsBreakdown voltagePower semiconductor devicePower lossesbusinessDiode
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2015

Electrically detected magnetic resonance (EDMR) is a commonly used technique for the study of spin-dependent transport processes in semiconductor materials and electro-optical devices. Here, we present the design and implementation of a compact setup to measure EDMR, which is based on a commercially available benchtop electron paramagnetic resonance (EPR) spectrometer. The electrical detection part uses mostly off-the-shelf electrical components and is thus highly customizable. We present a characterization and calibration procedure for the instrument that allowed us to quantitatively reproduce results obtained on a silicon-based reference sample with a “large-scale” state-of-the-art instru…

Materials scienceSiliconSpectrometerbusiness.industrySemiconductor device fabricationAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementCharacterization (materials science)law.inventionOrganic semiconductorchemistryHardware_GENERALlawvisual_artElectronic componentvisual_art.visual_art_mediumCalibrationOptoelectronicsbusinessElectron paramagnetic resonanceAIP Advances
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