Search results for "Metrology"

showing 10 items of 96 documents

Hybrid optical-digital method for local-displacement analysis by use of a phase-space representation.

2010

A method for evaluating the local deformation or displacement of an object in speckle metrology is described. The local displacements of the object in one direction are digitally coded in a one-dimensional specklegram. By optically performing the local spectrum of this pattern, one simultaneously achieves information about the local displacement and its spatial position. The good performance of this technique is demonstrated with computer-generated test signals.

business.industryComputer scienceMaterials Science (miscellaneous)Industrial and Manufacturing EngineeringDisplacement (vector)MetrologySpeckle patternOpticsInterference (communication)Position (vector)Phase spaceSpatial frequencySpeckle imagingBusiness and International ManagementbusinessApplied optics
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GHOST: GRADIENT HISTOGRAM OF SPECTRAL TEXTURE

2021

International audience; A gradient-based texture feature for hyperspectral image is formulated with straightforward application to grayscale and color images. Processed in full band, GHOST is expressed as a four-dimensional probability density distribution encompassing joint metrological assessment of spectral and spatial properties. Its performance is close to Opponent Band Local Binary Pattern (OBLBP) in HyTexiLa texture classification (91 %-99 % accuracy) with feature size 0.2 % of OBLBP's.

business.industryHyperspectral imagingPattern recognitionGrayscaleTexture (geology)MetrologyImage (mathematics)gradientmetrology[INFO.INFO-TI] Computer Science [cs]/Image Processing [eess.IV]Feature (computer vision)HistogramComputer Science::Computer Vision and Pattern Recognition[INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]spectralGraphical modelArtificial intelligencebusinesstextureMathematics
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High-contrast sub-Doppler absorption spikes in a hot atomic vapor cell exposed to a dual-frequency laser field

2017

International audience; The saturated absorption technique is an elegant method widely used in atomic and molecular physics for high-resolution spectroscopy, laser frequency standards and metrology purposes. We have recently discovered that a saturated absorption scheme with a dual-frequency laser can lead to a significant sign reversal of the usual Doppler-free dip, yielding a deep enhanced-absorption spike. In this paper, we report detailed experimental investigations of this phenomenon, together with a full in-depth theoretical description. It is shown that several physical effects can support or oppose the formation of the high-contrast central spike in the absorption profile. The physi…

coherent population trappingGeneral Physics and Astronomy01 natural scienceslaw.invention010309 opticssymbols.namesakelawLaser cooling0103 physical sciencesvapor cellPhysics::Atomic Physics010306 general physicsAbsorption (electromagnetic radiation)Spectroscopyoptical pumpingPhysicsQuantum optics[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]Doppler-free spectroscopydual-frequency laserLaserAtomic clockMetrologyHanle effectsymbolsAtomic physics[PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph]Doppler effect
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Comparison of mechanical properties and composition of magnetron sputter and plasma enhanced atomic layer deposition aluminum nitride films

2018

A comparative study of mechanical properties and elemental and structural composition was made for aluminum nitride thin films deposited with reactive magnetron sputtering and plasma enhanced atomic layer deposition (PEALD). The sputtered films were deposited on Si (100), Mo (110), and Al (111) oriented substrates to study the effect of substrate texture on film properties. For the PEALD trimethylaluminum–ammonia films, the effects of process parameters, such as temperature, bias voltage, and plasma gas (ammonia versus N2/H2), on the AlN properties were studied. All the AlN films had a nominal thickness of 100 nm. Time-of-flight elastic recoil detection analysis showed the sputtered films t…

elastic moduliMaterials scienceta22102 engineering and technologySubstrate (electronics)mechanical propertiesNitride01 natural sciencesAtomic layer depositionSputtering0103 physical sciencesTexture (crystalline)Composite materialThin filmta216kemiallinen analyysiAlNsputter deposition010302 applied physicsta114Surfaces and InterfacesSputter deposition021001 nanoscience & nanotechnologyCondensed Matter PhysicsX-ray diffractionfysikaaliset ominaisuudetSurfaces Coatings and FilmsElastic recoil detectionmetrologythin filmsAtomic Layer DepositionmetrologiaALDmechanical testingchemical analysisaluminum nitridesputteringohutkalvot0210 nano-technologyJournal of Vacuum Science & Technology A
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Improved calculations of beta decay backgrounds to new physics in liquid xenon detectors

2020

We present high-precision theoretical predictions for the electron energy spectra for the ground-state to ground-state $\beta$ decays of $^{214}$Pb, $^{212}$Pb, and $^{85}$Kr most relevant to the background of liquid xenon dark matter detectors. The effects of nuclear structure on the spectral shapes are taken into account using large-scale shell model calculations. Final spectra also include atomic screening and exchange effects. The impact of nuclear structure effects on the $^{214}$Pb and $^{212}$Pb spectra below $\approx100$ keV, pertinent for several searches for new physics, are found to be comparatively larger than those from the atomic effects alone. We find that the full calculatio…

electronElectron01 natural sciencesSpectral lineHigh Energy Physics - ExperimentspectrumHigh Energy Physics - Experiment (hep-ex)Xenon[PHYS.HEXP]Physics [physics]/High Energy Physics - Experiment [hep-ex]beta-raysground stateNuclear Experiment (nucl-ex)Nuclear Experimentnuclear instrumentationPhysicsinstrumentationxenon: liquidnew physics: search forNuclear structureaxial-vectorsemileptonic decayCoupling (probability)simulation3. Good healthradioactivityGround stateionizing radiationSemileptonic decay[PHYS.NUCL]Physics [physics]/Nuclear Theory [nucl-th]energy spectrumFOS: Physical scienceschemistry.chemical_elementspectrum analysis[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]Nuclear physics0103 physical sciencesstructure[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]010306 general physicsnumerical calculationssignal processingPseudovectorkryptonnucleus: semileptonic decayleaddetector010308 nuclear & particles physicsbackgroundscreeningDecay data measurementshell modelnuclear matter: effectdark matter: detector[INFO.INFO-MO]Computer Science [cs]/Modeling and Simulationcoupling: axial-vectorxenonmetrologychemistry13. Climate actionspectralelectron: energy spectrum
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Multiparameter quantum critical metrology

2022

Single parameter estimation is known to benefit from extreme sensitivity to parameter changes in quantum critical systems. However, the simultaneous estimation of multiple parameters is generally limited due to the incompatibility arising from the quantum nature of the underlying system. A key question is whether quantum criticality may also play a positive role in reducing the incompatibility in the simultaneous estimation of multiple parameters. We argue that this is generally the case and verify this prediction in paradigmatic quantum many-body systems close to first and second order phase transitions. The antiferromagnetic and ferromagnetic 1-D Ising chain with both transverse and longi…

first order quantum phase transitionquantum Fisher information matrixcontinuous quantum phase transitionQuantum PhysicsSettore FIS/02 - Fisica Teorica Modelli E Metodi Matematicimultiparameter quantum metrologyquantumneFOS: Physical sciencesGeneral Physics and Astronomyscaling propertiesQuantum Physics (quant-ph)SciPost Physics
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Metrological performances of voltage and current instrument transformers in harmonics measurements

2018

In the new electrical system scenario, the increasing presence of non-linear loads and renewable energy sources makes the measurement of harmonics an essential task. The accuracy of harmonic measurement firstly depends on the used instrument transformers for voltage and current sensing. Since the behavior of instrument transformers in non-sinusoidal conditions is not always well defined, this paper presents an experimental study on the metrological performances of current and voltage instrument transformers (CTs and VTs) in the presence of harmonics. Proper tests procedures are defined and measurement setups are developed for both CTs and VTs calibration. The analysis is carried out by usin…

instrument transformers020209 energy02 engineering and technologyInstrument TransformerHarmonic analysispower system meaurementsPhase AngleDistortionharmonics0202 electrical engineering electronic engineering information engineeringCalibrationElectronic engineeringMedicineSafety Risk Reliability and QualityInstrumentationbusiness.industry020208 electrical & electronic engineeringHarmonicPower System MeasurementcalibrationCurrent transformerMetrologyHarmonicsHarmonicbusinessSettore ING-INF/07 - Misure Elettriche E ElettronicheVoltage
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Phase-Sensitive Detection for Optical Sensing With Porous Silicon

2012

We report on a photonic sensor with an ultralow limit of detection (LoD) based on a phase interrogation readout scheme together with an anisotropic porous silicon (PSi) membrane. First, the fabrication of porous free-standing membranes from medium doped (100) surface oriented silicon, with pore diameters suitable for the infiltration of biomolecules, around 50 nm, is reported. Then, the phase interrogation scheme for characterizing the PSi membranes is presented whose results show that while volumetric sensitivity increases with the membrane thickness, the resolution in the birefringence measurements decrease dramatically due to depolarization effects. The best LoD was found to be equal to …

lcsh:Applied optics. PhotonicsMaterials scienceFabricationSiliconchemistry.chemical_elementPorous siliconOpticsPhase (matter)lcsh:QC350-467Electrical and Electronic EngineeringDetection limitBirefringencebusiness.industrySensorsDopingscatteringlcsh:TA1501-1820Atomic and Molecular Physics and Opticssubwavelength structuresMembranemetrologychemistryOptoelectronicsfabrication and characterizationbusinesslcsh:Optics. LightIEEE Photonics Journal
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Measurement

2020

The basic idea of measurement is that objects exhibit an attribute for which questions like “do objects exhibit the attribute to the same degree or for any pair of them does one exhibit it more or less than the other?” make sense. It implies ordering objects that show an equal, a greater or lesser amount of one attribute, The notion of order is captured by the concept of a binary relation that is at least a weak order. Stevens (1946, 1951) classified four types of scales through which the assignment of objects to numbers can be achieved. These two approaches converge on the Representational Theory of Measurement, according to which it is the construction of functions from a set of data to a…

measure theory epistemology metrologySettore M-PSI/01 - Psicologia GeneraleSettore M-FIL/02 - Logica E Filosofia Della ScienzaSettore M-FIL/05 - Filosofia E Teoria Dei Linguaggi
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Robustness of asymmetry and coherence of quantum states

2016

Quantum states may exhibit asymmetry with respect to the action of a given group. Such an asymmetry of states can be considered as a resource in applications such as quantum metrology, and it is a concept that encompasses quantum coherence as a special case. We introduce explicitly and study the robustness of asymmetry, a quantifier of asymmetry of states that we prove to have many attractive properties, including efficient numerical computability via semidefinite programming, and an operational interpretation in a channel discrimination context. We also introduce the notion of asymmetry witnesses, whose measurement in a laboratory detects the presence of asymmetry. We prove that properly c…

media_common.quotation_subjectFOS: Physical sciencesContext (language use)01 natural sciencesAsymmetry010305 fluids & plasmasRobustness (computer science)Quantum stateQuantum mechanics0103 physical sciencesQuantum metrologyStatistical physics010306 general physicsQuantumMathematical PhysicsQCmedia_commonPhysicsQuantum PhysicsMathematical Physics (math-ph)Coherence (statistics)Computational Physics (physics.comp-ph)Condensed Matter - Other Condensed MatterSpectral asymmetryQuantum Physics (quant-ph)Physics - Computational PhysicsOther Condensed Matter (cond-mat.other)Physical Review A
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