Search results for "Microscopy"
showing 10 items of 3390 documents
Thermal conductivity of half-Heusler superlattices
2014
Thin films and superlattices (SLs) of TiNiSn and ZrHfNiSn layers have been grown by dc magnetron sputtering on MgO (100) substrates to reduce the thermal conductivity, aiming for improvement of the thermoelectric figure of merit ZT. The thermal conductivity of 1 Wm−1K−1 was measured by the differential 3ω method for an SL with a periodicity of 8.8 nm. In addition to x-ray diffraction analysis of the SL crystal structure, smooth interfaces were confirmed by scanning/transmission electron microscopy.
Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…
2016
Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…
Electron diffraction, X-ray powder diffraction and pair-distribution-function analyses to determine the crystal structures of Pigment Yellow 213, C23…
2009
The crystal structure of the nanocrystalline alpha phase of Pigment Yellow 213 (P.Y. 213) was solved by a combination of single-crystal electron diffraction and X-ray powder diffraction, despite the poor crystallinity of the material. The molecules form an efficient dense packing, which explains the observed insolubility and weather fastness of the pigment. The pair-distribution function (PDF) of the alpha phase is consistent with the determined crystal structure. The beta phase of P.Y. 213 shows even lower crystal quality, so extracting any structural information directly from the diffraction data is not possible. PDF analysis indicates the beta phase to have a columnar structure with a si…
Computation of near field diffraction by a dielectric grating: a comparison with experiments
1995
We use an eigenmode method to compute the near field diffracted by one-dimensional dielectric gratings. We present a set of easily programmable recurrence relations that give the diffracted field from the incident one. The numerical results are compared with the experimental images obtained with the Photon Scanning Tunneling Microscope (PSTM).
Study of spatial lateral resolution in off-axis digital holographic microscopy
2015
The lateral resolution in digital holographic microscopy (DHM) has been widely studied in terms of both recording and reconstruction parameters. Although it is understood that once the digital hologram is recorded the physical resolution is fixed according to the diffraction theory and the pixel density, still some researches link the resolution of the reconstructed wavefield with the recording distance as well as with the zero-padding technique. Aiming to help avoiding these misconceptions, in this paper we analyze the lateral resolution of DHM through the variation of those two parameters. To support our outcomes, we have designed numerical simulations and experimental verifications. Both…
IMAGING OF DICHROISM IN PHOTOEMISSION ELECTRON MICROSCOPY AT NONMAGNETIC MATERIALS USING CIRCULARLY POLARIZED SOFT X-RAYS
2002
A new approach for investigations of circular dichroism in the angular distribution of photoelectrons (CDAD) is presented. The image contrast using a photoemission line of a certain material is combined with imaging of the angular distribution pattern using a photoemission electron microscope (PEEM). CDAD can be used to investigate pure scattering information by means of the same instrument in microscopically selected regions on a surface. The experiment combines angle-resolved XPS imaging with the indirect mapping of the local environment of atoms by means of CDAD holography. In a conventional photoelectron diffraction or photoelectron holography experiment, it is necessary to move the sa…
Critical Appraisal of the Pore Structure of MCM-41
2006
Purely siliceous and aluminosilicate types of MCM-41 were synthesized and characterized by means of X-ray diffraction (XRD), transmission electron microscopy (TEM), nitrogen sorption (NS) and size exclusion chromatography (SEC).
Ab Initio Structure Determination of Vaterite by Automated Electron Diffraction
2012
tion that is fundamental for understanding material properties. Still, a number of compounds have eluded such kinds of analysis because they are nanocrystalline, highly disordered, with strong pseudosymmetries or available only in small amounts in polyphasic or polymorphic systems. These materials are crystallographically intractable with conventional Xray or synchrotron radiation diffraction techniques. Single nanoparticles can be visualized by high-resolution transmission electron microscopy (HR-TEM) up to sub�ngstrom resolution, [2] but obtaining 3D information is still a difficult task, especially for highly beam-sensitive materials and crystal structures with long cell parameters. Elec…
Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy.
2019
A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illumination spectral content and the residual compo- nent that appears from wrongly estimated phase-shifts. The estimation of the phase-shifts is carried out by finding the absolute maximum of a function defined as the normalized peak intensity difference in the Fourier domain. This task is performed by an optimization method providing a fast estimation of the phase-shift. The algorithm stability an…
A study of a differential method for a field diffracted by a rough surface
2006
Since more than one decade, a new generation of microscopes was developed. It is about near field microscopes. Among these devices, we are interested in the PSTM (Photon Scanning Tunnelling Microscopy). Images obtained by this instrument do not reflect, with a better resolution, the topography of the studied samples. In order to improve the performance of this apparatus, several models have been developed. In our case, we propose to retake, by using a differential method, the study of a rough surface. The surface is modelled as two pavements of different sizes and refractive indices. Theoretically, the obtained results agree well with results obtained for a surface having submicronic asperi…