Search results for "N-oxide"
showing 10 items of 155 documents
CCDC 689012: Experimental Crystal Structure Determination
2008
Related Article: B.R.D.Nayagam, S.R.Jebas, H.J.Jeyakumar, D.Schollmeyer|2008|Acta Crystallogr.,Sect.E:Struct.Rep.Online|64|o928|doi:10.1107/S1600536808011446
CCDC 1935912: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935907: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935911: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935921: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935925: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935926: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935920: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1935929: Experimental Crystal Structure Determination
2020
Related Article: Rakesh Puttreddy, J. Mikko Rautiainen, Toni Mäkelä, Kari Rissanen|2019|Angew.Chem.,Int.Ed.|58|18610|doi:10.1002/anie.201909759
CCDC 1557848: Experimental Crystal Structure Determination
2017
Related Article: Filip Topić, Rakesh Puttreddy, J. Mikko Rautiainen, Heikki M. Tuononen, Kari Rissanen|2017|CrystEngComm|19|4960|doi:10.1039/C7CE01381G