Search results for "Optoelectronics"
showing 10 items of 2306 documents
Subwavelength surface waves with zero diffraction
2011
We identified nanostructured devices sustaining out-of-plane nondiffracting beams with near-grazing propagation and a transverse beamwidth clearly surpassing the diffraction limit of half a wavelength. This type of device consists of a planar multilayered metal-dielectric structure with a finite number of films deposited on a solid transparent substrate. We assumed that the nondiffracting beam is launched from the substrate. The construction of the subwavelength diffraction-free beam is attended by plane waves which are resonantly transmitted through the stratified medium. Therefore, light confinement and wave amplification occurs simultaneously. We performed an optimization process concern…
White-light-modified Talbot array illuminator with a variable density of light spots.
2008
A flexible array illuminator, comprising only two conventional optical elements, with a variable density of bright white-light spots is presented. The key to our method is to obtain with a single diffractive lens an achromatic version of different fractional Talbot images, produced by free-space propagation, of the amplitude distribution at the back focal plane of a periodic refractive microlens array under a broadband point-source illumination. Some experimental results of our optical procedure are also shown.
Experimental observation of temporal dispersion gratings in fiber optics
2017
We experimentally demonstrate a temporal analog to the diffraction optical grating in the Fraunhofer formalism. Using amplitude and phase temporal periodic modulations, we show that the accumulation of dispersion in fiber optics induces the development of temporally well-separated sidebands similar to the spatial orders of diffraction that are commonly observed in an optical grating operating in the far field.
Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by Hard X-ray synchrotron nanoprobes
2019
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary hard X-ray synchrotron techniques at the nanoscale have been applied to the study of individual nanowires (NWs) containing non-polar GaN/InGaN multi-quantum-wells. The trace elemental sensitivity of X-ray fluorescence allows one to determine the In concentration of the quantum wells and their inhomogeneities along the NW. It is also possible to rule out any contamination from the gold nanoparticle …
Diffraction-managed superlensing using metallodielectric heterostructures
2012
We show that subwavelength diffracted wave fields may be managed inside multilayered plasmonic devices to achieve ultra-resolving lensing. For that purpose we first transform both homogeneous waves and a broad band of evanescent waves into propagating Bloch modes by means of a metal/dielectric (MD) superlattice. Beam spreading is subsequently compensated by means of negative refraction in a plasmon-induced anisotropic effective-medium that is cemented behind. A precise design of the superlens doublet may lead to nearly aberration-free images with subwavelength resolution in spite of using optical paths longer than a wavelength. This research was funded by the Spanish Ministry of Economy and…
Totally incoherent optical processing operations with achromatic diffraction-based setups
2000
We report on a novel family of totally incoherent, chromatic-dispersion compensated hybrid (refractive-diffractive) lens setups for implementing, in the Fraunhofer or in the Fresnel diffraction region, different achromatic diffraction-based processing operations.
Visible light apparatus for preliminary tests of x-ray optics
2006
We report a useful visible light testing procedure for a first analysis of soft X-ray grazing incidence optics (0.1-2 keV). Although diffraction is a limit in the application of this method, great advantages are obtained by running the tests in air with direct access to modify the geometrical mounting of the individual mirror shells. We present the experimental apparatus and show the first results of the investigation of light weight optics based on plastic foil material and comparison with results obtained with an X-ray beam.
Asymmetric transmission of transverse magnetic or radially polarized THZ waves through sub-wavelength gratings
2015
We have developed a metallic double circular grating with sub-wavelength slits which blocks radially polarized light incident from one of its sides and acts as a focusing diffractive element in the other direction. The proposed grating has been optimized for the sub-THz frequency range. Unidirectional transmission through the grating has been demonstrated experimentally at 0.1 THz. We have also developed a planar metallic double grating with sub-wavelength slits which blocks light with a transverse magnetic polarization incident from one of the grating sides and transmits radiation incident from the opposite direction into the +1 and −1 diffraction orders. These gratings which could be used…
Dispersion Compensation in Holograms Reconstructed by Femtosecond Light Pulses
2014
This chapter describes how the spatiotemporal dispersion associated with the diffraction of broadband femtosecond light pulses through computer generated holograms (CGHs) can be compensated to a first order with a properly designed dispersion compensation module (DCM). The angular dispersion of the beam associated to CGHs leads to both spatial and temporal distortion of the pulse. Some experiments in one-shot second harmonic generation, wide-field two-photon microscopy, and parallel micromachining are shown to study the quality of the compensation performed with the DCM.
Structural analysis of CdO layers grown on r-plane sapphire (011¯2) by metalorganic vapor-phase epitaxy
2004
Abstract High-quality fully relaxed CdO layers have been grown directly on r -plane sapphire by metalorganic vapor-phase epitaxy. The crystalline structure has been analyzed by high-resolution X-ray diffraction. The structural quality of the (0 0 1) oriented layers degrades as the growth temperature decreases, process which is accompanied by the appearance of pyramidal grains as revealed by scanning force microscopy. The lattice parameters, perpendicular and parallel to the sample surface, have been determined by means of reciprocal space maps taken on asymmetrical reflections and measurements of symmetrical reflections at different azimuths. The epitaxial relationships between the CdO laye…