Search results for "PASSIVE FILMS"
showing 9 items of 19 documents
Influences of Structure and Composition on the Photoelectrochemical Behaviour of Anodic Films on Zr and Zr-20at.%Ti
2008
Abstract A photoelectrochemical investigation on anodic films of different thickness grown on sputter-deposited Zr and Zr–20 at.%Ti was carried out. The estimated optical band gap and flat band potential of thick ( U F ≥ 50 V) anodic films were related to their crystalline structure and compared with those obtained for thinner ( U F ≤ 8 V/SCE) anodic oxides having undetermined crystalline structure. The E g values obtained by photocurrent spectroscopy were also compared with the experimental band gap estimated by other optical ex situ techniques and with the available theoretical estimates of the zirconia electronic structures in an attempt to reconcile the wide range of band gap data rep…
Physicochemical Characterization of Passive Films and Corrosion Layers by Differential Admittance and Photocurrent Spectroscopy
2009
Two different electrochemical techniques, differential admittance and photocurrent spectroscopy, for the characterization of electronic and solid state properties of passive films and corrosion layers are described and critically evaluated. In order to get information on the electronic properties of passive film and corrosion layers as well as the necessary information to locate the characteristic energy levels of the passive film/electrolyte junction like: flat band potential (Ufb), conduction band edge (EC) or valence band edge (EV), a wide use of Mott-Schottky plots is usually reported in corrosion science and passivity studies. It has been shown, in several papers, that the use of simpl…
Photoelectrochemical Techniques in Corrosion Studies
2005
Physico-chemical characterization of passive films on 316L stainless steel grown in high temperature water
2014
A Chemical Approach to the Modelling of Band Gap of Passive Films for Corrosion Studies
2015
Photocurrent Spectroscopy (PCS) has gained a large consideration in the last decades as in situ technique for the characterization of semiconductors and photoconducting passive film/electrolyte junctions being able to provide information on the location of characteristic energy levels like: flat band potential (Ufb), internal photoemission threshold (Eth) and band gap value (Eg)
Photoelectrochemical and XPS Characterization of Passive films Grown on 316L Stainless Steel in High Temperature Water
2015
One of the major materials challenge for continued safe, reliable and cost-effective utilization of watercooled nuclear reactors for electricity production is development of improved understanding of the synergistic fundamental mechanisms responsible for corrosion and stress corrosion cracking degradation of austenitic steels and nickel base alloys
Characterization of Thin Passive Film-Electrolyte Junctions.The Amorphous Semiconductor (a-SC) Schottky Barrier Approach
2016
The knowledge of the solid-state properties of passive film is a preliminary task for a full understanding of the electron and ion transfer processes at the metal/oxide and oxide/electrolyte interface. Both processes are of paramount importance in determining the mechanism of film growth and dissolution as well as in determining the nature of the breakdown during the growth of anodic oxide films or the onset of generalized or localized corrosion process (1-2). With very few exceptions, it is a common belief, that most of anodic oxide films, grown on metals and alloys in aqueous solutions, display a semiconducting or insulating behaviour. It is also very well known that in many cases the ini…