Search results for "Reticle"

showing 2 items of 2 documents

InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering.

2011

Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.

Indium nitrideMaterials sciencePhononGeneral Physics and AstronomyPhysics::Optics:Matemàtiques i estadística::Matemàtica discreta::Combinatòria [Àrees temàtiques de la UPC]Nitridechemistry.chemical_compoundCondensed Matter::Materials ScienceWurtzite alnOpticsAb initio quantum chemistry methodsDispersion relationThin filmHexagonal InNPseudopotentialsWurtzite crystal structureCondensed matter physicsbusiness.industryScatteringLattice dynamics:Enginyeria electrònica [Àrees temàtiques de la UPC]Reticles Teoria dechemistryFISICA APLICADAbusinessSpectroscopic techniquesDinàmica reticularFundamental-band gapPhysical review letters
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Vectofocimetry: Dioptric power measurement in manual focimeters using power vectors

2021

Abstract Dioptric power measurement is classically achieved using manual focimeters. In this contribution, we present vectofocimetry as a novel methodology to be easily implemented in manual focimeters for improving their capabilities regarding dioptric power measurement. The new procedure is conceptually based on power vector formalism of dioptric power which represents the dioptric power as three values in the form of [M, J0, J45], it uses an iterative process of blur reduction, and it only requires a few modifications in the device that are easy-to-adapt and cost-effective. As a result, dioptric power measurements are easily and quickly obtained with comparable results to the reported on…

Iterative and incremental developmentObservational errorComputer sciencebusiness.industryMechanical EngineeringOptical instrumentProcess (computing)UsabilityAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsPower (physics)law.inventionReduction (complexity)lawReticleElectrical and Electronic EngineeringbusinessAlgorithmOptics and Lasers in Engineering
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