Search results for "SCOPE"

showing 10 items of 2420 documents

A study of a differential method for a field diffracted by a rough surface

2006

Since more than one decade, a new generation of microscopes was developed. It is about near field microscopes. Among these devices, we are interested in the PSTM (Photon Scanning Tunnelling Microscopy). Images obtained by this instrument do not reflect, with a better resolution, the topography of the studied samples. In order to improve the performance of this apparatus, several models have been developed. In our case, we propose to retake, by using a differential method, the study of a rough surface. The surface is modelled as two pavements of different sizes and refractive indices. Theoretically, the obtained results agree well with results obtained for a surface having submicronic asperi…

DiffractionSurface (mathematics)MicroscopeField (physics)business.industryChemistryResolution (electron density)Near and far fieldCondensed Matter PhysicsBiochemistrylaw.inventionOpticslawMicroscopyPhysical and Theoretical ChemistrybusinessRefractive indexJournal of Molecular Structure: THEOCHEM
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Superresolved Holographic Microscopy

2008

Superresolution methods in digital holographic microscopy provide a useful tool to overcome the Abbe's diffraction limit when using modest microscope lenses. The process improves the cutoff frequency of the microscope lens by means of the generation of a synthetic aperture based on time multiplexing and using 3 main stages: optical coding, optical decoding, and digital postprocessing. After the whole process, a superresolved image is obtained by Fourier transformation of the synthetic aperture.

DiffractionSynthetic aperture radarMaterials scienceMicroscopebusiness.industryHolographyPhysics::Opticslaw.inventionLens (optics)symbols.namesakeOpticsFourier transformlawMicroscopysymbolsDigital holographic microscopybusinessImaging & Microscopy
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Investigation of AC Electrical Properties of MXene-PCL Nanocomposites for Application in Small and Medium Power Generation

2021

The paper examined Ti3C2Tx MXene (T—OH, Cl or F), which is prepared by etching a layered ternary carbide Ti3AlC2 (312 MAX-phase) precursor and deposited on a polycaprolactone (PCL) electrospun membrane (MXene-PCL nanocomposite). X-ray Diffraction analysis (XRD) and Scanning Electron Microscopy (SEM) indicates that the obtained material is pure Ti3C2 MXene. SEM of the PCL-MXene composite demonstrate random Ti3C2 distribution over the nanoporous membrane. Results of capacitance, inductance, and phase shift angle studies of the MXene-PCL nanocomposite are presented. It was found that the frequency dependence of the capacitance exhibited a clear sharp minima in the frequency range of 50 Hz to o…

DiffractionTechnologyControl and OptimizationNanocompositeMaterials scienceRenewable Energy Sustainability and the EnvironmentScanning electron microscopeTEnergy Engineering and Power TechnologyMXene-PCL nanocompositesElectronflexible electronicsCapacitanceMolecular physicsInductanceAmplitudeelectrical propertiesElectrical and Electronic EngineeringMXeneTernary operationEngineering (miscellaneous)small and medium power generationEnergy (miscellaneous)Energies
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Determinant role of the edges in defining surface plasmon propagation in stripe waveguides and tapered concentrators

2012

International audience; In this paper, we experimentally show the effect of waveguide discontinuity on the propagation of the surface plasmon in metal stripes and tapered terminations. Dual-plane leakage microscopy and near-field microscopy were performed on Au stripes with varied widths to imag29e the surface plasmon intensity distribution in real and reciprocal spaces. We unambiguously demonstrate that edge diffraction is the limiting process determining the cutoff conditions of the surface plasmon mode. Finally, we determine the optimal tapered geometry leading to the highest transmission.

DiffractionTotal internal reflectionMaterials sciencebusiness.industrySurface plasmonNanophotonicsPhysics::OpticsStatistical and Nonlinear Physics02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesSurface plasmon polaritonAtomic and Molecular Physics and Opticslaw.inventionOpticslaw0103 physical sciencesNear-field scanning optical microscope[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physics0210 nano-technologybusinessWaveguideLocalized surface plasmon
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Phase separation as a key to a thermoelectric high efficiency

2012

This work elucidates the possible reasons for the outstanding, but never reproduced thermoelectric properties of the doped Ti(0.5)Zr(0.25)Hf(0.25)NiSn Heusler compounds. The structural investigations done via synchrotron X-ray diffraction measurements and scanning electron microscope measurements, which clearly show that the microstructure consists of three temperature stable C1(b) phases with possible semi-coherent interfaces, are presented. The exceptional thermoelectric properties are due to this intrinsic phase separation. It is possible to reproduce the high Figure of Merit values with ZT = 1.2 at 830 K. Furthermore, the influence of doping different elements on the Sn position in this…

DiffractionWork (thermodynamics)Materials scienceCondensed matter physicsScanning electron microscopeDopingGeneral Physics and AstronomyMicrostructureSynchrotronlaw.inventionCrystallographylawThermoelectric effectFigure of meritPhysical and Theoretical ChemistryPhys. Chem. Chem. Phys.
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Assessing the particle size of a broadly dispersed powder by complementary techniques

1998

The experimental determination of reliable particle size distribution curves and statistical parameters of broad distributions is known to be a difficult task. This problem is addressed here in an attempt to characterize the granularity of three distinct batches of a pharmaceutical powder (fenofibrate from Fournier Laboratories). The methodology consists in comparing the results, expressed in terms of surface based mean diameter, as obtained by three complementary techniques, namely optical microscopy image analysis, laser light low angle diffraction and surface area measurement by krypton physisorption. These techniques are applied in parallel to the material of interest and to a certified…

Diffractionbusiness.industryKryptonStatistical parameterPharmaceutical Sciencechemistry.chemical_elementlaw.inventionCertified reference materialsOpticschemistryOptical microscopelawParticle-size distributionParticle sizeGranularityBiological systembusinessInternational Journal of Pharmaceutics
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Domain shapes and monolayer structures of triple-chain phospholipids on water

1994

Two triple-chain phospholipid isomers were investigated at the air-water interface by means of fluorescence microscopy and grazing incidence X-ray diffraction (GID). The two lipids differ only in the position of the branched chain at the glycerol backbone. Fluorescence microscopy shows different domain sharp-edged domains. In the case of dendritic domains the chains are more tilted, the deviation from hexagonal symmetry is more pronounced and hence the lattice anisotropy is larger.

Diffractionbusiness.industryPhospholipidGeneral Physics and AstronomyEpitaxyQuantitative Biology::Subcellular Processeschemistry.chemical_compoundCrystallographyOpticschemistryLattice (order)MonolayerFluorescence microscopeThin filmbusinessAnisotropyIl Nuovo Cimento D
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Structural, microstructural and impedance spectroscopy study of functional ferroelectric ceramic materials based on barium titanate

2013

The differences between the physical properties of barium titanate BaTiO3 and newly obtained BaHfxTi1-xO3 were identified. These ceramics were prepared by solid-phase reaction from simple oxides and carbonates using the conventional method. The structure and morphology of investigated samples were characterised by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The application of impedance spectroscopy made possible to characterize of these materials in the terms of electrical properties.

Diffractionchemistry.chemical_compoundMaterials sciencechemistryScanning electron microscopevisual_artBarium titanatevisual_art.visual_art_mediumMineralogyCeramicComposite materialFerroelectricityDielectric spectroscopyIOP Conference Series: Materials Science and Engineering
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Microscopic evidence of a flat melting curve of tantalum

2010

International audience; New data on the high-pressure melting curve of Ta up to 48GPa are reported. Evidence of melting from changes in sample texture was found in five different experiments using scanning electron microscopy. The obtained melting temperatures are in excellent agreement with earlier measurements using x-ray diffraction or the laser-speckled method but are in contrast with several theoretical calculations. The results are also compared with shock-wave data. These findings are of geophysical relevance because they confirm the validity of earlier experimental techniques that resulted in low melting slopes of the transition metals measured in the diamond-anvil cell, including i…

Diffractionlaser-heatingMaterials sciencehigh-pressurePhysics and Astronomy (miscellaneous)Scanning electron microscope62.50.-p64.70.djTantalumAnalytical chemistrychemistry.chemical_element02 engineering and technology01 natural sciencesdiamond-anvil cellDiamond anvil cellMelting curve analysistransition metalsTransition metal0103 physical sciencesTexture (crystalline)010306 general physics62.50.EfAstronomy and Astrophysics021001 nanoscience & nanotechnologyCrystallographyGeophysicsmelting curvechemistrySpace and Planetary Science0210 nano-technologyMelting-point depression
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Using FOCUS to solve zeolite structures from three-dimensional electron diffraction data

2013

The programFOCUS[Grosse-Kunstleve, McCusker & Baerlocher (1997).J. Appl. Cryst.30, 985–995] was originally developed to solve zeolite structures from X-ray powder diffraction data. It uses zeolite-specific chemical information (three-dimensional 4-connected framework structure with known bond distances and angles) to supplement the diffraction data. In this way, it is possible to compensate, at least in part, for the ambiguity of the reflection intensities resulting from reflection overlap, and the program has proven to be quite successful. Recently, advances in electron microscopy have led to the development of automated diffraction tomography (ADT) and rotation electron diffraction (R…

Diffractionzeolites02 engineering and technology010402 general chemistry01 natural sciencesGeneral Biochemistry Genetics and Molecular Biologylaw.inventionautomated diffraction tomography; computer programs; rotation electron diffraction; structure solution; zeolitesDiffraction tomographyOpticslawstructure solutionautomated diffraction tomographyrotation electron diffractionbusiness.industryChemistryScattering021001 nanoscience & nanotechnologycomputer programs0104 chemical sciencesElectron diffractionDirect methodsCrystalliteElectron microscope0210 nano-technologybusinessPowder diffractionJOURNAL OF APPLIED CRYSTALLOGRAPHY
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