Search results for "Scanning Probe Microscopy"

showing 10 items of 49 documents

Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM2Te2 (M = Co, Ni)

1998

The compounds TaNi2Te2 and TaCo2Te2 have been examined by scanning tunneling and atomic force microscopy. The title phases crystallize in layered structures with metal slabs sandwiched by tellurium atoms. Scanning probe microscope images of the surfaces of these materials arise from the surface tellurium atoms anddepending on the experimental conditionscan show very different features. The images have been simulated through surface charge densities calculated within the Extended Huckel and LMTO frameworks.

Materials scienceGeneral Chemical EngineeringAnalytical chemistrychemistry.chemical_elementCharge densityGeneral ChemistryMicrostructureScanning probe microscopychemistryMicroscopyPhysics::Atomic and Molecular ClustersMaterials ChemistryLamellar structurePhysics::Atomic PhysicsSurface chargeTelluriumElectronic band structureChemistry of Materials
researchProduct

Scanning probe microscopy of pine and birch kraft pulp fibres

2000

Abstract Fibres of the conventional pine and birch kraft pulps were characterized by scanning probe microscopy (SPM). The surface characteristics of these pulps taken at the early stages of pulping were compared with those from later stages of pulping (with or without subsequent oxygen/alkali delignification). It was observed that during delignification a granular surface structure was replaced by a fibrillar surface containing various disruptions. The granular and fibrillar regions were particularly well resolved by using phase imaging in tapping mode of SPM. It was concluded that the granular structure corresponded to surface lignin since the decrease in the relative amount of the granula…

Materials scienceKappa valuePolymers and PlasticsfungiOrganic Chemistrychemistry.chemical_elementSurface concentrationOxygenstomatognathic diseasesScanning probe microscopychemistry.chemical_compoundstomatognathic systemchemistryKraft processChemical engineeringPhase (matter)Materials ChemistryLigninComposite materialKraft paperPolymer
researchProduct

<title>Metallic and semiconducting nanowires: properties and architectures</title>

2003

Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in-situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires. Additionally, in this paper we describe a novel approach for synthesizing mesoporous silicas with tunable pore diameters, wall thickness and pore spacings that can be used as tempates for the assembly of se…

Materials scienceNanocompositeSiliconbusiness.industryNanowirechemistry.chemical_elementNanotechnologyGermaniumMesoporous silicaScanning probe microscopySemiconductorchemistryMesoporous materialbusinessSPIE Proceedings
researchProduct

Smart High-κ Nanodielectrics Using Solid Supported Polyoxometalate-Rich Nanostructures

2011

Utilizing Langmuir-Blodgett deposition and scanning probe microscopy, we have investigated the extent to which cations alter the self-assembly processes of hybrid polyoxometalates (POMs) on surfaces. The well-defined 2D hexagonal nanostructures obtained were extensively characterized and their properties were studied, and this has revealed fascinating dielectric behavior and reversible capacitive properties. The nanostructures are extremely stable under ambient conditions, and yet exhibit fascinating self-patterning upon heating. These findings present POMs as effective smart nanodielectrics and open up a new field for future POM applications. (c) 2011 American Chemical Society.

Materials scienceNanostructureMacromolecular SubstancesSurface PropertiesMolecular ConformationGeneral Physics and AstronomyNanotechnologyDielectricsurfacesSmart materialScanning probe microscopyMaterials TestingElectric ImpedanceIntelligent materialsGeneral Materials ScienceParticle SizeCation exchangesDielectric behaviorPolyoxometalateHexagonal crystal systemPolyoxometalatesGeneral EngineeringOxidesself-assemblyTungsten CompoundsSelf assemblyNanodielectricsNanostructuresHigh-κ NanodielectricSelf assembly processScanning probe microscopyLangmuir-Blodgett depositionPositive ionsPolyoxometalateSelf-assembly2D-hexagonalAmbient conditions
researchProduct

Near-field study with a photon scanning tunneling microscope: Comparison between dielectric nanostructure and metallic nanostructure

2007

Abstract Scanning near-field optical microscopy (SNOM) integrates standard optical methods with scanning probe microscopy (SPM) techniques allowing to collect optical information with resolution well beyond the diffraction limit. We study the influence on image formation of several parameters in scanning near-field microscopy. The numerical calculations have been carried out using the differential method. We investigate a 2D-PSTM configuration with a dielectric rectangular object. We will focus on the collection type SNOM in a constant height scanning mode. Various oscillation patterns are observed from both sides of the nanostructure, which we interpret as interference between the diffract…

Materials scienceNanostructurebusiness.industryMechanical EngineeringPhysics::OpticsNear and far fieldCondensed Matter PhysicsPolarization (waves)law.inventionScanning probe microscopyOpticsOptical microscopeMechanics of MaterialslawMicroscopyGeneral Materials ScienceNear-field scanning optical microscopeScanning tunneling microscopebusinessMaterials Science and Engineering: B
researchProduct

Near-field observation of evanescent light wave coupling in subwavelength optical waveguides

2002

International audience; We report the observation, in the range of visible frequencies, of the coupling of light into integrated waveguides of subwavelength cross-sections together with a subwavelength detection at the output, of such guides. Coupling in is produced by controlling the focusing of a laser beam totally reflected at the surface of the sample. Several tens of micrometres long dielectric ridges have been efficiently excited with this technique. The phenomenon is observed in direct space by a Photon Scanning Tunneling Microscope which also allows to test the principle of detection in a subwavelength volume.

Materials sciencePhoton[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsGeneral Physics and AstronomyPhysics::OpticsNear and far fieldZONE02 engineering and technologyDielectric01 natural scienceslaw.inventionGUIDESScanning probe microscopyOpticslaw0103 physical sciences[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physicsCouplingbusiness.industryNear-field opticsMICROSCOPY021001 nanoscience & nanotechnologyExcited state[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsScanning tunneling microscope0210 nano-technologybusiness
researchProduct

Atomic Force Microscopy and Spectroscopy

2021

Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of experimental methods known as scanning probe microscopy. AFM is primarily designed to obtain the morphology of the surface of a solid material by using the force of interaction between an inert probe and the sample. The AFM microscope can generally be operated in many ways for morphology investigations, but they can be roughly classified into two main groups: static- and dynamic-deflection modes. Since atomic force microscopy makes use of tip-surface interaction to reconstruct the surface morphology of materials, it is of fundamental importance to fully understand the nature and properties of …

Materials scienceScanning probe microscopyAtomic force microscopySettore FIS/01 - Fisica SperimentaleAnalytical chemistryAtomic force microscopy spectroscopyStatic-deflection modesDynamic-deflection modesSpectroscopySpectroscopy for Materials Characterization
researchProduct

Imaging of photonic nanopatterns by scanning near-field optical microscopy

2002

We define photonic nanopatterns of a sample as images recorded by scanning near-field optical microscopy with a locally excited electric dipole as a probe. This photonic nanopattern can be calculated by use of the Green’s dyadic technique. Here, we show that scanning near-field optical microscopy images of well-defined gold triangles taken with the tetrahedral tip as a probe show a close similarity to the photonic nanopattern of this nanostructure with an electric dipole at a distance of 15 nm to the sample and tilted 45° with respect to the scanning plane.

Materials sciencebusiness.industryScanning confocal electron microscopyPhysics::OpticsStatistical and Nonlinear PhysicsScanning gate microscopyScanning capacitance microscopyAtomic and Molecular Physics and Opticslaw.inventionScanning probe microscopyOpticslawScanning ion-conductance microscopyNear-field scanning optical microscopeScanning tunneling microscopebusinessVibrational analysis with scanning probe microscopyJournal of the Optical Society of America B
researchProduct

Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy.

2003

Abstract The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe–metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

Materials sciencebusiness.industryScanning tunneling spectroscopySurface plasmonPhysics::OpticsSpin polarized scanning tunneling microscopyAtomic and Molecular Physics and OpticsElectrochemical scanning tunneling microscopeElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticsInterference (communication)lawScanning tunneling microscopebusinessInstrumentationLocalized surface plasmonUltramicroscopy
researchProduct

Curvature effects in surface plasmon dispersion and coupling

2005

We have studied the resonant coupling of surface plasmons in curved thin-film tunneling geometries by obtaining the dispersion relations for the system. The surface plasmon dispersion relations are calculated for a metal-coated dielectric probe above a dielectric half space with and without metal coating. The system is modeled in the prolate spheroidal system, and the dispersion relations are studied as functions of the parameter that defines the boundaries of the tip and the corresponding coating, and as functions of the involved coating thicknesses. Using this type of probe-substrate configuration, the nonradiative surface plasmon coupling mechanism is investigated in the visible spectrum…

Materials sciencebusiness.industrySurface plasmonPhysics::OpticsDielectricCondensed Matter PhysicsMolecular physicsSurface plasmon polaritonElectronic Optical and Magnetic MaterialsScanning probe microscopyOpticsDispersion relationDispersion (optics)Surface plasmon resonancebusinessLocalized surface plasmonPhysical Review B
researchProduct