Search results for "Secondary electrons"
showing 10 items of 23 documents
Characterisation of structured thin films made from complex materials by photoabsorption spectromicroscopy
1998
Al3 and YBa2Cu3O7/PrBa2Cu3O7. To investigate devices built from these complex materials we applied element-sensitive photoemission electron microscopy (PEEM). Information about the chemical composition of the imaged sample can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired microscopic images using photon energies near and at the edges. Such images give the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of the true secondary electrons in selected spots during a sweep of the photon energy. The main aim of our work was to observe oxygen-related defects and changes in the c…
Untersuchungen zur Mehrfach-Emission von Sekund�relektronen
1964
CuBe- and NaCl-targets are bombarded by single electrons (100–600 eV). The secondary electrons accelerated by 40 kV strike the crystal of a scintillation counter, backed by a multichannel analyser. The probabilityP n of emission ofn=0, 1, 2, 3, ... secondaries can be found from the pulse height distribution. The probability distributionP n =f(n) shows a characteristic deviation from aPoisson's distribution. There was no evidence that there is a preference for even numbers ofn as found byBarrington andAnderson.
Interpretation of AMS-02 electrons and positrons data
2014
We perform a combined analysis of the recent AMS-02 data on electrons, positrons, electrons plus positrons and positron fraction, in a self-consistent framework where we realize a theoretical modeling of all the astrophysical components that can contribute to the observed fluxes in the whole energy range. The primary electron contribution is modeled through the sum of an average flux from distant sources and the fluxes from the local supernova remnants in the Green catalog. The secondary electron and positron fluxes originate from interactions on the interstellar medium of primary cosmic rays, for which we derive a novel determination by using AMS-02 proton and helium data. Primary positron…
Zur Energieverteilung der Sekund�relektronen aus Isolatoren
1960
The energy spectrum of secondary electrons from insulators has been measured using primary electrons of a beam density of 10−13 to 10−14 A/cm2 and detecting single secondaries by an Allen-type multiplier.
Untersuchung verschiedener Elektronenemissionsprozesse auf Mehrfachemission
1965
A comparison of the pulse hight distribution of several electron emission processes is drawn. Thermionic electrons, photoelectrons, field electrons and exoelectrons are found to be emitted as single electrons.
Nachweis der Mehrfachemission von Sekund�relektronen mittels Proportionalz�hlrohr
1965
A proportional counter is used as analyser for electron energies (in the range 10 to 20 keV). The resolving power for 20 keV is 21%. The multiple emission of secondary electrons is investigated with this counter.
Zur Sekund�relektronenemission durch Argonionen und Argonatome im Energiebereich von 1 bis 20 keV
1966
Be-, CuBe-, Cu- and Al-targets are bombarded by single A+ and A0 in the energy range from 1 to 20 keV. The secondary electrons accelerated by 20 keV are counted by a proportional counter backed by a multichannel analyser. The probability distributionPn of emission ofn=0,1, 2, 3, ... secondary electrons can be found from the pulse height distribution. WhenPn is known the yield for A+ and A0 can be calculated. The counting of neutrals in the energy range investigated is discussed.
The large-area micro-channel plate entrance detector of the heavy-ion magnetic spectrometer PRISMA
2005
This paper describes the entrance detector of the magnetic spectrometer PRISMA recently installed at Legnaro. The detector is based on rectangular (80 x 100 mm(2)) Micro-Channel Plates (MCP). It provides a fast time signal and its position-sensitive anode allows to extract the X and Y information. It exploits an electrostatic field for the acceleration of secondary electrons from a thin Carbon foil (similar or equal to 20 mu g/cm(2)) onto the MCP assembly. The electrons are guided by a parallel magnetic field. Good performances were obtained in the laboratory tests. The detector is presently installed at the entrance of PRISMA and gives resolutions <= 400 ps in time, and 1 mm in both X and …
Secondary electron flight times and tracks in the carbon foil time pick-up detector
2014
Carbon foil time pick-up detectors used in the time-of-flight measurements of MeV energy ions have been studied in connection to time-of-flight-energy spectrometer used for heavy ion elastic recoil detection analysis. In experimental coincident TOF-E data characteristic halos are observed around light element isobars, and the origin of these halos were studied. The experimental data indicated that these halos originate from single electron events occurring before the electron multiplication in the microchannel plate. By means of electron trajectory simulations, this halo effect is explained to originate from single electron, emitted from the carbon foil, hitting the non-active area of the m…
Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials
1999
Abstract We applied chemical and magnetic sensitive photoemission electron microscopy (PEEM) to investigate surfaces of advanced materials. PEEM at low photon energies provides a high spatial resolution, but suffers from the lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in…