Search results for "avalanche"
showing 3 items of 23 documents
THE SILICON PHOTOMULTIPLIER:AN IN-DEPTH ANALYSIS IN THE CONTINUOUS WAVE REGIME
2014
The Silicon Photomultiplier (SiPM) is a novel solid state photon counting detector consisting of a parallel array of avalanche photodiodes biased beyond their breakdown voltage. It has known a fast development in the last few years as a possible alternative to vacuum photomultiplier tubes (PMTs) and conventional avalanche photodiodes (APDs). Indeed, current research in photodetectors is directed toward an increasing miniaturization of the pixel size, thus both improving the spatial resolution and reducing the device dimensions. SiPMs show high photon detection efficiency in the visible and near infrared range, low power consumption, high gain, ruggedness, compact size, excellent single-phot…
Ray optics behavior of flux avalanche propagation in superconducting films
2015
Experimental evidence of wave properties of dendritic flux avalanches in superconducting films is reported. Using magneto-optical imaging the propagation of dendrites across boundaries between a bare NbN film and areas coated by a Cu layer was visualized, and it was found that the propagation is refracted in full quantitative agreement with Snell's law. For the studied film of 170 nm thickness and a $0.9\phantom{\rule{0.28em}{0ex}}\ensuremath{\mu}\mathrm{m}$ thick metal layer, the refractive index was close to $n=1.4$. The origin of the refraction is believed to be caused by the dendrites propagating as an electromagnetic shock wave, similar to damped modes considered previously for normal …
Ray optics behavior of flux avalanche propagation in superconducting films
2015
Experimental evidence of wave properties of dendritic flux avalanches in superconducting films is reported. Using magneto-optical imaging the propagation of dendrites across boundaries between a bare NbN film and areas coated by a Cu layer was visualized, and it was found that the propagation is refracted in full quantitative agreement with Snell’s law. For the studied film of 170 nm thickness and a 0.9 μm thick metal layer, the refractive index was close to n = 1.4. The origin of the refraction is believed to be caused by the dendrites propagating as an electromagnetic shock wave, similar to damped modes considered previously for normal metals. The analogy is justified by the large dissipa…