Search results for "ellipsometry"
showing 10 items of 49 documents
Amorphous ultra-wide bandgap ZnOx thin films deposited at cryogenic temperatures
2020
Crystalline wurtzite zinc oxide (w-ZnO) can be used as a wide band gap semiconductor for light emitting devices and for transparent or high temperature electronics. The use of amorphous zinc oxide (a-ZnO) can be an advantage in these applications. In this paper we report on X-ray amorphous a-ZnOx thin films (~500 nm) deposited at cryogenic temperatures by reactive magnetron sputtering. The substrates were cooled by a nitrogen flow through the copper substrate holder during the deposition. The films were characterized by X-ray diffraction (XRD), Raman, infrared, UV-Vis-NIR spectroscopies, and ellipsometry. The a-ZnOx films on glass and Ti substrates were obtained at the substrate holder temp…
Band gap of corundumlike α−Ga2O3 determined by absorption and ellipsometry
2017
The electronic structure near the band gap of the corundumlike $\ensuremath{\alpha}$ phase of ${\mathrm{Ga}}_{2}{\mathrm{O}}_{3}$ has been investigated by means of optical absorption and spectroscopic ellipsometry measurements in the ultraviolet (UV) range (400--190 nm). The absorption coefficient in the UV region and the imaginary part of the dielectric function exhibit two prominent absorption thresholds with wide but well-defined structures at 5.6 and 6.3 eV which have been ascribed to allowed direct transitions from crystal-field split valence bands to the conduction band. Excitonic effects with large Gaussian broadening are taken into account through the Elliott-Toyozawa model, which y…
Determination of refractive index of submicron-thick films using resonance shift in a four-layer slab waveguide
2017
The measurement of refractive index of very thin films at the order of ten to hundred nanometers is cumbersome and usually requires employing sophisticated techniques such as the spectral ellipsometry. In this paper we describe a simple contact method for measuring the refractive index of thin films. Here we have used the prism-coupling technique for characterizing samples prepared as four-layer slab waveguides. The waveguide resonance condition can be calculated by solving simple analytic transcendental equations for the slab waveguide. Then the captured mode position as a function of cladding thickness is used for probing the refractive index of cladding layer. We used indium-tin-oxide la…
Polypyrrole films functionalized with pendant titanocene dichloride complexes: Ellipsometric study of the electropolymerization process
2007
Electrochemical and ellipsometric methods have been used to study the electropolymerization process of a functionalized monomer, Tc3Py (in which pyrrole is covalently bonded with titanocene dichloride complex) on platinum electrode from a dilute monomer solution in acetonitrile. The deposition has been performed in the potentiodynamic regime. A new method for the acquisition and treatment of ellipsometric data has been proposed which allowed us to analyze the evolution of the film properties at each potential. The model of a single uniform layer was unable to describe the ellipsometric experimental observations with the necessary precision. A proper fitting of the data has been achieved con…
On the formation of inclusion complexes at the solid/liquid interface of anchored temperature-responsive PNIPAAM diblock copolymers with γ-cyclodextr…
2017
The thermal responsive behavior of adsorbed layers of diblock copolymers of poly(N-isopropylacrylamide) (PNIPAAM) and poly((3-acrylamidopropyl)trimethylammonium chloride) (PAMPTMA(+)) with γ-cyclodextrin (γ-CD) at the solid/liquid interface has been investigated using three in situ techniques: null ellipsometry, quartz–crystal microbalance with dissipation monitoring, and neutron reflectometry. The measurements provided information about the adsorbed amounts, the layer thickness, hydration and viscoelastic properties, and the interfacial structure and composition. The copolymers adsorb to silica with the cationic PAMPTMA(+) blocks sitting as anchors in a flat conformation and the PNIPAAM ch…
Ellipsometric study of the physisorption of benzene on graphite
1987
The optical thickness of benzene on the (001) surface of a graphite single crystal has been studied by ellipsometry. Ellipsometric adsorption isotherms have been measured in the temperature range from 180 to 290 K. The maximum thickness of the adsorbed benzene film is constant in this temperature range and compares favourably with the value expected for one monolayer of molecules lying flat on the surface.
Reactive direct current magnetron sputtered TiO2 thin films with amorphous to crystalline structures.
2008
International audience; TiO2 thin films were deposited on soda–lime glass substrates by reactive direct current magnetron sputtering in a mixture of pure argon and oxygen. The influence of both the deposition time, td, and the post-annealing treatments on the films morphology, composition and structure was analyzed by scanning electron microscopy, ellipsometry, X-ray photoelectrons spectroscopy, X-ray diffraction (XRD) and Raman spectroscopy. Amorphous TiO2 was obtained for the shortest deposition time, td=15 min. Increasing td up to 30 min, poorly crystallized anatase and rutile phases were formed together with amorphous TiO2, as was revealed by complementary XRD patterns and Raman spectra…
Tailoring the Structural, Optical, and Photoluminescence Properties of Porous Silicon/TiO2 Nanostructures
2015
The structural, optical, and photoluminescence properties of porous silicon (PSi)/titanium dioxide (TiO2) nanostructures were investigated. PSi structures consisting of macro- and mesoporous layers were fabricated by metal-assisted chemical etching, and then TiO2 was introduced inside the PSi matrix using the atomic layer deposition technique. We performed scanning electron microscopy, transmission electron microscopy (TEM), X-ray diffraction, energy dispersive X-ray spectroscopy, Raman spectroscopy, ellipsometry, and photoluminescence (PL) spectroscopy to characterize the prepared and annealed PSi/TiO2 nanostructures. TEM and Raman analyses revealed that TiO2 had a crystalline anatase stru…
In-situ characterisation of organosilane films formation on aluminium alloys by electrochemical quartz crystal microbalance and in-situ ellipsometry
2005
Abstract Organosilane pre-treatments have been studied intensively during the last years in order to replace hexavalent chromium conversion treatments. The aim of this study is to follow in-situ the formation of this organosilane layer in solution. Two in-situ techniques, spectroscopic ellipsometry and electrochemical quartz crystal microbalance, were used to investigate the mechanism and the kinetics of this protective film formation. In-situ measurements highlight that the organosilane film observed after the drying process is not formed into the solution, but during the emersion and drying step. Hence, it has been possible to characterise the presence of a very thin organosilane layer in…