Search results for "integrated"

showing 10 items of 1783 documents

Measurements methodology for the reliability evaluation of intelligent power modules

2014

The paper describes a measurement methodology for the reliability evaluation of new intelligent power electronics modules (IPMs). In particular, the evaluation of the IPMs immunity to radio frequency conducted disturbances has been performed, at different operating thermal conditions, designing a suitable measurement set up in a shielded room. Moreover, the thermal performances of the devices have been analyzed, setting up a proper experimental test bench. The measurements procedures are detailed described. © 2014 IEEE.

Electromagnetic compatibility (EMC)Engineeringbusiness.industryPower moduleEMCintegrated power electronic modulesControl engineeringbusinessSettore ING-INF/07 - Misure Elettriche E Elettronicheelectrothermal effectReliability (statistics)Reliability engineering
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Sub-wavelength imaging of light confinement and propagation in SOI based photonic crystal devices

2006

A light source is coupled into photonic crystal devices and a near field optical probe is used to observe the electromagnetic field propagation and distribution at a sub-wavelength scale. Bloch modes are clearly observed.

Electromagnetic fieldMaterials sciencebusiness.industryPhotonic integrated circuitNear-field opticsFinite-difference time-domain methodPhysics::OpticsSilicon on insulatorNear and far fieldOpticsOptoelectronicsNear-field scanning optical microscopebusinessPhotonic crystal
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A method of variation of boundaries for waveguide grating couplers

2008

We describe a method for calculating the solution of the electromagnetic field in a non-rectilinear open waveguide by using a series expansion, starting from the field of a rectilinear waveguide. Our approach is based on a method of variation of boundaries. We prove that the obtained series expansion converges and we provide a radiation condition at infinity in such a way that the problem has a unique solution. Our approach can model several kinds of optical devices which are used in optical integrated circuits. Numerical examples will be shown for the case of finite aperiodic waveguide grating couplers.

Electromagnetic fieldPhysicsField (physics)business.industryApplied MathematicsPhysics::Opticswave propagationIntegrated circuitVariation (game tree)Radiationoptical waveguidesWaveguide (optics)law.inventionOpticsAperiodic graphlawHelmholtz equationbusinessSeries expansionAnalysisApplicable Analysis
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"Table 1" of "Measurement of the $e^{+}e^{-} \to \eta J/\psi$ cross section and search for $e^{+}e^{-} \to \pi^{0} J/\psi$ at center-of-mass energies…

2016

Results on $e^{+}e^{-}\to\eta J/\psi$ in data samples in which a signal is observed with a statistical significance larger than $5\sigma$. The table shows the CM energy $\sqrt{s}$, integrated luminosity $\mathcal{L}_\mathrm{int}$, number of observed $\eta$ events $N^\mathrm{obs}_{\eta}(\mu^{+}\mu^{-})$/$N^\mathrm{obs}_{\eta}(e^{+}e^{-})$ from the fit, efficiency $\epsilon_{\mu}/\epsilon_{e}$, radiative correction factor $(1+\delta^{r})$, vacuum polarization factor $(1+\delta^{v})$, Born cross section $\sigma^{B}(\mu^{+}\mu^{-})$/$\sigma^{B}(e^{+}e^{-})$ and combined Born cross section $\sigma^{B}_\mathrm{Com}$. The first uncertainties are statistical and the second systematic.

Electron ProductionE+ E- --> ETA J/PSI4.19-4.42Astrophysics::High Energy Astrophysical PhenomenaE+ E- ScatteringIntegrated Cross SectionEFFExclusiveHigh Energy Physics::ExperimentNCross SectionSIG
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"Table 2" of "Measurement of the $e^{+}e^{-} \to \eta J/\psi$ cross section and search for $e^{+}e^{-} \to \pi^{0} J/\psi$ at center-of-mass energies…

2016

Upper limits of $e^{+}e^{-} \to \eta J/\psi$ using the $\mu^{+}\mu^{-}$ mode. The table shows the CM energy $\sqrt{s}$, integrated luminosity $\mathcal{L}_\mathrm{int}$, number of observed $\eta$ events $N^\mathrm{sg}_{\eta}$, number of background from $\eta$ sideband $N^\mathrm{sb}_{\eta}$, and from $J/\psi$ sideband $N^\mathrm{sb}_{J/\psi}$, efficiency $\epsilon$, upper limit of signal number with the consideration of selection efficiency $N^\mathrm{up}_{\eta}/\epsilon$ (at the $90\%$ C.L.), radiative correction factor $(1+\delta^{r})$, vacuum polarization factor $(1+\delta^{v})$, Born cross section $\sigma^{B}$ and upper limit on the Born cross sections $\sigma^{B}_\mathrm{up}$ (at the $…

Electron ProductionE+ E- --> ETA J/PSIE+ E- ScatteringIntegrated Cross SectionEFFExclusiveHigh Energy Physics::ExperimentNCross SectionNuclear ExperimentSIG3.81-4.6
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"Table 1" of "Search for the isospin violating decay $Y(4260)\rightarrow J/\psi \eta \pi^{0}$"

2016

Results on $e^{+}e^{-}\rightarrow J/\psi\eta\pi^{0}$. Listed in the table are the integrated luminosity $\cal{L}$, radiative correction factor (1+$\delta^{r}$) taken from QED calculation assuming the $Y(4260)$ cross section follows a Breit$-$Wigner line shape, vacuum polarization factor (1+$\delta^{v}$), average efficiency ($\epsilon^{ee}{\cal B}^{ee}$ + $\epsilon^{\mu\mu}{\cal B}^{\mu\mu}$), number of observed events $N^\text{obs}$, number of estimated background events $N^\text{bkg}$, the efficiency corrected upper limits on the number of signal events $N^\text{up}$, and upper limits on the Born cross section $\sigma^\text{Born}_\text{UL}$ (at the 90 $\%$ C.L.) at each energy point.

Electron ProductionE+ E- ScatteringIntegrated Cross SectionEFFExclusiveE+ E- --> J/PSI ETA PI0NCross SectionSIG4.009-4.599
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"Table 9" of "The $e^+ e^-\to 2(\pi^+\pi^-)\pi^0$, 2(\pi^+\pi^-)\eta$, $K^+ K^-\pi^+\pi^-\pi^0$ and $K^+ K^-\pi^+\pi^-\eta$ Cross Sections Measured w…

2007

Measured cross section for E+ E- --> PHI ETA with statistical errors only.

Electron production1.56-2.64E+ E- ScatteringIntegrated Cross SectionExclusiveHigh Energy Physics::ExperimentCross SectionNuclear ExperimentSIGE+ E- --> PHI ETA
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"Table 6" of "The $e^+ e^-\to 2(\pi^+\pi^-)\pi^0$, 2(\pi^+\pi^-)\eta$, $K^+ K^-\pi^+\pi^-\pi^0$ and $K^+ K^-\pi^+\pi^-\eta$ Cross Sections Measured w…

2007

Measured cross section for E+ E- --> ETAPRIME PI+ PI- with statistical errors only.

Electron production1.58-3.42E+ E- ScatteringIntegrated Cross SectionExclusiveCross SectionE+ E- --> ETAPRIME PI+ PI-SIG
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"Table 5" of "Lowest Q**2 measurement of the gamma* p --> delta reaction: Probing the pionic contribution."

2006

Unpolarized cross sections as a function of the azimuthal pion angle relative to the virtual photon direction from which the extracted results were taken (to be published).

Electron production7.950E-017.950E-01Integrated Cross SectionE- P --> E- PI0 PExclusiveCross SectionNuclear ExperimentSIG1.221
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"Table 7" of "Lowest Q**2 measurement of the gamma* p --> delta reaction: Probing the pionic contribution."

2006

Unpolarized cross sections as a function of the azimuthal pion angle relative to the virtual photon direction from which the extracted results were taken (to be published).

Electron production7.950E-017.950E-01Integrated Cross SectionE- P --> E- PI0 PExclusiveCross SectionNuclear ExperimentSIG1.221
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