Search results for "molecular beam epitaxy"

showing 3 items of 73 documents

Growth of zinc-blende GaN on muscovite mica by molecular beam epitaxy

2021

Abstract The mechanisms of plasma-assisted molecular beam epitaxial growth of GaN on muscovite mica were investigated. Using a battery of techniques, including scanning and transmission electron microscopy, atomic force microscopy, cathodoluminescence, Raman spectroscopy and x-ray diffraction, it was possible to establish that, in spite of the lattice symmetry mismatch, GaN grows in epitaxial relationship with mica, with the [11–20] GaN direction parallel to [010] direction of mica. GaN layers could be easily detached from the substrate via the delamination of the upper layers of the mica itself, discarding the hypothesis of a van der Waals growth mode. Mixture of wurtzite (hexagonal) and z…

[PHYS]Physics [physics]Materials scienceMechanical EngineeringMuscoviteNucleationBioengineeringCathodoluminescence02 engineering and technologyGeneral Chemistryengineering.material010402 general chemistry021001 nanoscience & nanotechnologyEpitaxy01 natural sciences0104 chemical sciencesCrystallographyMechanics of MaterialsTransmission electron microscopyengineeringGeneral Materials ScienceMicaElectrical and Electronic Engineering0210 nano-technologyWurtzite crystal structureMolecular beam epitaxy
researchProduct

Material quality characterization of CdZnTe substrates for HgCdTe epitaxy

2006

Cd1−xZnxTe (CZT) substrates were studied to investigate their bulk and surface properties. Imperfections in CZT substrates affect the quality of Hg1−xCdxTe (MCT) epilayers deposited on them and play a role in limiting the performance of infrared (IR) focal plane arrays. CZT wafers were studied to investigate their bulk and surface properties. Transmission and surface x-ray diffraction techniques, utilizing both a conventional closed-tube x-ray source as well as a synchrotron radiation source, and IR transmission micro-spectroscopy, were used for bulk and surface investigation. Synchrotron radiation offers the capability to combine good spatial resolution and shorter exposure times than conv…

business.industryChemistryNeutron diffractionSynchrotron Radiation SourceSynchrotron radiationCondensed Matter PhysicsEpitaxySettore ING-INF/01 - ElettronicaCadmium telluride photovoltaicsElectronic Optical and Magnetic MaterialsOpticsMaterials ChemistryCadmium alloysCadmium tellurideGrain boundaryWaferElectrical and Electronic EngineeringbusinessMolecular beam epitaxyMolecular beam epitaxy
researchProduct

X-ray absorption near-edge structure of GaN with high Mn concentration grown on SiC.

2009

By means of x-ray absorption near-edge structure (XANES) several Ga(1-x)Mn(x)N (0.03x0.09) layers have been analyzed. The Mn-doped GaN samples consisted of different epilayers grown by molecular beam epitaxy on [0001] SiC substrates. The low mismatch between GaN and SiC allows for a good quality and homogeneity of the material. The measurements were performed in fluorescence mode around both the Ga and Mn K edges. All samples studied present a similar Mn ionization state, very close to 2+, and tetrahedral coordination. In order to interpret the near-edge structure, we have performed ab initio calculations using the full potential linear augmented plane wave method as implemented in the Wien…

chemistry.chemical_compoundValence (chemistry)Absorption edgeAbsorption spectroscopyChemistryBand gapAnalytical chemistryGeneral Materials ScienceGallium nitrideCondensed Matter PhysicsSpectroscopyXANESMolecular beam epitaxyJournal of physics. Condensed matter : an Institute of Physics journal
researchProduct